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Update on the 2D-DIC Challenge: Results and Conclusions

  • P. L. Reu
  • E. Toussaint
  • E. Jones
  • H. Bruck
  • M. Iadicola
  • R. Balcaen
  • D. Turner
  • T. Siebert
  • P. Lava
  • M. Simonsen
  • M. Grewer
Conference paper
Part of the Conference Proceedings of the Society for Experimental Mechanics Series book series (CPSEMS)

Abstract

The 2D-DIC Challenge is organized by an international committee working to understand the accuracy of digital image correlation (DIC) through standardized image sets. The DIC Challenge is run under the auspices of the Society for Experimental Mechanics (SEM) and the International DIC Society (iDICs). The 2D-Challenge incorporates 19 image sets that can be used in evaluating 2D-DIC algorithms. The full results of the study and description of the image sets may be found in Reu et al. (Exp Mech, 2017). A new round of the 2D Challenge is being launched at SEM 2018 and will seek to probe the concept of spatial resolution.

Keywords

Digital image correlation (DIC) Full-field Optical methods Uncertainty quantification (UQ) Aliasing 

Notes

Acknowledgements

I would like to thank the DIC Challenge board for their help in completing this work, as well as the DIC Challenge participants. Without broad collaboration, making progress on these important DIC measurement problems would be difficult or impossible.

Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA-0003525.

References

  1. 1.
    Reu, P.L., et al.: DIC challenge: developing images and guidelines for evaluating accuracy and resolution of 2D analyses. Exp. Mech. (2017)Google Scholar
  2. 2.
    Reu, P.: Experimental and numerical methods for exact subpixel shifting. Exp. Mech. 51(4), 443–452 (2011)CrossRefGoogle Scholar
  3. 3.
    Orteu, J.-J., et al.: A Speckle Texture Image Generator. SPIE (2006)Google Scholar
  4. 4.
    Grediac, M., Blaysat, B., Sur, F.: A critical comparison of some metrological parameters characterizing local digital image correlation and grid method. Exp. Mech. 57(6), 871–903 (2017)CrossRefGoogle Scholar

Copyright information

© The Society for Experimental Mechanics, Inc. 2019

Authors and Affiliations

  • P. L. Reu
    • 1
  • E. Toussaint
    • 2
  • E. Jones
    • 1
  • H. Bruck
    • 3
  • M. Iadicola
    • 4
  • R. Balcaen
    • 5
  • D. Turner
    • 1
  • T. Siebert
    • 6
  • P. Lava
    • 7
  • M. Simonsen
    • 8
  • M. Grewer
    • 9
  1. 1.Sandia National LaboratoriesAlbuquerqueUSA
  2. 2.Université Clermont AuvergneClermont-FerrandFrance
  3. 3.University of MarylandCollege ParkUSA
  4. 4.National Institute of StandardsGaithersburgUSA
  5. 5.KU LeuvenGhentBelgium
  6. 6.Dantec Dynamics GmbHUlmGermany
  7. 7.MatchIDGhentBelgium
  8. 8.Correlated Solutions Inc.ColumbiaUSA
  9. 9.LaVision GmbHGoettingenGermany

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