From Material/Device Degradation to Time-to-Failure
In Chap. 3, it was suggested that material/device degradation will occur with time and that this continuing degradation will eventually cause device failure. Methods were presented in Chap. 3 which can be used for modeling the time-dependence of degradation. The question that we would like to address in this chapter is—how does one go from the time-dependence of degradation to the time-to-failure for the device? The time-to-failure (TF) equations are critically important, for device failure mechanisms, and will be the focus of the remaining chapters in this book.