From Material/Device Degradation to Time-to-Failure

  • J. W. McPherson


In Chap.  3, it was suggested that material/device degradation will occur with time and that this continuing degradation will eventually cause device failure. Methods were presented in Chap.  3 which can be used for modeling the time-dependence of degradation. The question that we would like to address in this chapter is—how does one go from the time-dependence of degradation to the time-to-failure for the device? The time-to-failure (TF) equations are critically important, for device failure mechanisms, and will be the focus of the remaining chapters in this book.

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© Springer Nature Switzerland AG 2019

Authors and Affiliations

  • J. W. McPherson
    • 1
  1. 1.McPherson Reliability Consulting, LLCPlanoUSA

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