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Ramp-to-Failure Testing

  • J. W. McPherson
Chapter

Abstract

Engineers are constantly confronted with time issues. Applying a constant stress and waiting for failure can be very time-consuming. Thus, it is only natural to ask the question—does a rapid time-zero test exist that can be used on a routine sampling basis to monitor the reliability of the materials/devices? The answer to this question is often yes and it is called the ramp-to-failure test. While the test is destructive in nature (one has to sacrifice materials/devices), it is generally much more rapid than conventional constant-stress time-to-failure tests. The relative quickness of the test also enables the gathering of more data and thus the gathering of better statistics.

Bibliography

  1. Anolick, E. and G. Nelson: Low-Field Time-Dependent Dielectric Breakdown, IEEE International Reliability Symposium Proceedings, 8 (1979).Google Scholar
  2. Berman, A.: Time-Zero Dielectric Breakdown by a Ramp Method, IEEE International Reliability Symposium Proceedings, 204 (1981).Google Scholar
  3. McPherson, J.: Stress-Dependent Activation Energy, IEEE International Reliability Symposium Proceedings, 12 (1986).Google Scholar

Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  • J. W. McPherson
    • 1
  1. 1.McPherson Reliability Consulting, LLCPlanoUSA

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