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Organic Materials for Optoelectronic Applications

  • Andreas FurchnerEmail author
  • Dennis Aulich
Chapter
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 52)

Abstract

Material characterization in the wide field of optoelectronics often involves ellipsometric measurements. A deep knowledge of the sample properties, including anisotropy, is required for successful material analysis via optical modeling. This appendix provides thin-film optical constants n and k for commonly used organic materials used for transparent electrodes, solar cells, etc.

Copyright information

© Springer International Publishing AG, part of Springer Nature 2018

Authors and Affiliations

  1. 1.Leibniz-Institut für Analytische Wissenschaften – ISAS – e.V.BerlinGermany

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