Hamming Code Protection Method of FPGA-Based Space System

Conference paper
First Online:
Part of the Smart Innovation, Systems and Technologies book series (SIST, volume 82)

Abstract

FPGA is susceptible to single events upset (SEU) effect in space. SEU will lead to SRAM-based FPGA memory cell’s content changes which may result in system instability or even collapse. In this paper, the soft error probability model is established. For Hamming code protection, we have formulated an exact reliability model and estimated the consumption of system after conducting protection. Simulation test of ISE14.4 version XC4VSX55 models of FPGA is given. By the model simplification, the costs in power, area and speed of the protective methods are estimated.

Keywords

SEU Soft error Hamming code Protection costs 
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Notes

Acknowledgment

This work was supported by the National Natural Science Foundation of China under Grants No. 61571346.

References

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Copyright information

© Springer International Publishing AG 2018

Authors and Affiliations

  1. 1.Mechanical and Electrical EngineeringXidian UniversityXi’anChina

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