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Image Patch Matching Using Convolutional Descriptors with Euclidean Distance

  • Iaroslav Melekhov
  • Juho Kannala
  • Esa Rahtu
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 10118)

Abstract

In this work we propose a neural network based image descriptor suitable for image patch matching, which is an important task in many computer vision applications. Our approach is influenced by recent success of deep convolutional neural networks (CNNs) in object detection and classification tasks. We develop a model which maps the raw input patch to a low dimensional feature vector so that the distance between representations is small for similar patches and large otherwise. As a distance metric we utilize \(L_2\) norm, i.e. Euclidean distance, which is fast to evaluate and used in most popular hand-crafted descriptors, such as SIFT. According to the results, our approach outperforms state-of-the-art \(L_2\)-based descriptors and can be considered as a direct replacement of SIFT. In addition, we conducted experiments with batch normalization and histogram equalization as a preprocessing method of the input data. The results confirm that these techniques further improve the performance of the proposed descriptor. Finally, we show promising preliminary results by appending our CNNs with recently proposed spatial transformer networks and provide a visualisation and interpretation of their impact.

Keywords

Interest Point Image Patch Convolutional Neural Network Histogram Equalization Interest Point Detector 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer International Publishing AG 2017

Authors and Affiliations

  1. 1.Department of Computer ScienceAalto UniversityEspooFinland
  2. 2.Center for Machine Vision ResearchUniversity of OuluOuluFinland

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