Materials for Advanced Packaging pp 469-510 | Cite as
Die Attach Adhesives and Films
Abstract
This chapter outlines the strong correlation between developments in electronic packaging technologies and required properties of die attach materials. An overview of die attach materials is summarized with the trends in the market. Die attach paste, adhesive tape for a lead on chip (LOC), die attach film, and the prospects of advanced die attach film are described in each section. The technical requirements of the die attach materials, which include high purity, fast curing, low stress, high package crack resistance, and multi-chip packaging are discussed.
Die attach films have become the main stream of die attach materials owing to their excellent properties and reliability. The future of advanced die attach films is explained with the introduction of adhesive film with dicing/die attach dual functionality.
The effects of adhesive properties such as peel strength and water absorption to improve package crack resistance are reported in detail. The development of die attach films with micro-phase separation structure for multi-layered packaging process is reviewed. Evaluation of die attach materials for next generation packages is also introduced.
Keywords
Die attach Adhesives Films Package crack resistance Advanced BGA/CSP Multi-chip package Low stress Peel strength Water absorption Chip warpage Polyimide Epoxy resin Acrylic polymerReferences
- 1.Kayama S, Tanimoto M, Uchida S, Tsukada H, Suto T (1992) ASIC packaging technology handbook. Science ForumGoogle Scholar
- 2.Hagimoto E (1997) CSP technology. Kogyochosakai, TokyoGoogle Scholar
- 3.Kasuga T (1998) CSP/BGA technology. Nikkan Kogyo Shinbunsha, TokyoGoogle Scholar
- 4.Dotani A (2003) Semicon Japan 2003 navigator. Nikkei Microdev 49(2003)Google Scholar
- 5.Asakura H (1999) Nikkei Microdev 4:74Google Scholar
- 6.Fujita K (1998) Current die bonding technology. In: Proceedings of VLSI assembly technology forum Part II, ISS industrial systems, p 37Google Scholar
- 7.Takahashi K (2000) SEMI technology symposium, p 539Google Scholar
- 8.Makino N, Ichimura K (1981) Suzuki Electron Parts Mater 20(11):69Google Scholar
- 9.Yamazaki M (1996) Die bonding technology for high performance of LSI package. In: Proceedings of LSI assembly technology forum, ISS industrial systems, p 37Google Scholar
- 10.Kanno Y (1998) Current die bonding technology for novel package. In: Proceedings of VLSI assembly technology forum Part II, ISS industrial systems, p 1Google Scholar
- 11.Maekawa I (1998) Triceps 12:21Google Scholar
- 12.Ito G (1969) Keikinzoku/J Jpn Inst Light Metals 18(3):177Google Scholar
- 13.Bolger CJ (1982) 14th National SAMP technology conference, 12 OctoberGoogle Scholar
- 14.Bolger JC, Morano SL (1984) Adhes Age 27(7):17–20Google Scholar
- 15.Harada M (1992) Gekkan Semicond World 9:119Google Scholar
- 16.Kobayashi O (1994) Gekkan Semicond World 5:53Google Scholar
- 17.Ishio S, Maruyama T, Miyata K, Soda Y, Namii A, Toyozawa K, Fujita K, Kada M (1994) Technical report of the Institute of Electronics, Information and Communication Engineers, ICD94-155 (11), 65Google Scholar
- 18.Yamada K, Dohdoh T (2007) Electron Parts Mater 4:93Google Scholar
- 19.Uno T (1992) Gekkan Semicond World 9:114Google Scholar
- 20.Kawamura T, Suzuki T, Sugimoto H, Imai N, Kzuya M (1993) Hitachi cable. 12:37Google Scholar
- 21.Wasulko MW, Stauffer GA (1988) Microelectr Manuf Test, 9Google Scholar
- 22.Akada Y, Nakamoto K, Akazawa K (1991) Nitto Denko Tech Rep 29(2):69Google Scholar
- 23.Takeda S, Masuko T, Yusa M, Miyadera Y (1995) Die bonding adhesive film. Hitachi Chemical Technical Report, No. 24, p 25Google Scholar
- 24.Takeda S, Masuko T, Miyadera Y, Yamazaki M, Maekawa I (1997) A novel die bonding adhesive-silver filled film. In: Proceedings of 47th electronic components & technology conference (ECTC), 18–21 May 1997, San Jose, p 518Google Scholar
- 25.Yasuda M (2003) Hitachi chemical technical report (40): 7Google Scholar
- 26.Kato T, Uruno M (2000) Seikei-Kakou 12(5):246Google Scholar
- 27.Kato T, Suwa O, Fujii S, Yamazaki M, Masuko T (2004) Hitachi chemical technical report, 43, p 25Google Scholar
- 28.Haruta R (2007) J Jpn Inst Electron Packag 10(5):353CrossRefGoogle Scholar
- 29.Akejima S (2007) J Jpn Inst Electron Packag 10(5):375CrossRefGoogle Scholar
- 30.Matsuzaki T, Inada T, Hatakeyama K (2006) Hitachi chemical technical report, (46), 39Google Scholar
- 31.Ebe K, Senoo H, Yamazaki O (2006) J Adhes Soc Jpn 42(7):280CrossRefGoogle Scholar
- 32.Yoshida T (1994) Gekkan Semicond World 5:72Google Scholar
- 33.Li H, Johnson A, Wong CP (2003) IEEE Trans Compon Packag Technol 26(2):466CrossRefGoogle Scholar
- 34.Clair AKS, Clair TLS (1982) Polym Eng Sci 22(1):9CrossRefGoogle Scholar
- 35.Makino D (1994) Recent progress of the application of polyimides to microelectronics. In: Polymers for microelectronics, Kodansha, pp 380–402Google Scholar
- 36.Wilson D (1993) Recent advances in polyimide composites. High Perform Polym 5:77CrossRefGoogle Scholar
- 37.Harris FW, Beltz MW (1987) SAMPE J 23:6Google Scholar
- 38.Furukawa N, Yamada Y, Kimura Y (1996) High Perfom Polym 8:617CrossRefGoogle Scholar
- 39.Hedrick JL, Brown HR, Volksen W, Sanchez M (1997) Polymer 38(3):605CrossRefGoogle Scholar
- 40.Li L, Chung DDL (1991) Composites 22(3):211MathSciNetCrossRefGoogle Scholar
- 41.Nakamura Y (2002) J Adhes Soc Jpn 38(11):442Google Scholar
- 42.Gaw K, Kikei M, Kakimoto M, Imai Y (1996) React Funct Polym 30:85CrossRefGoogle Scholar
- 43.Su CC, Woo EM (1995) Polymer 36(15):2883CrossRefGoogle Scholar
- 44.Kimoto M (2000) J Adhes Soc Jpn 36(11):456CrossRefGoogle Scholar
- 45.Masuko T, Takeda S (2004) J Adhes Soc Jpn 40(4):136CrossRefGoogle Scholar
- 46.Masuko T, Takeda S (2004) J Netw Polym Jpn 25(4):181Google Scholar
- 47.Kawai A, Nagata H, Takata M (1992) Jpn J Appl Phys 31:1993CrossRefGoogle Scholar
- 48.Fowkes FM (1964) Ind Eng Chem 56:40CrossRefGoogle Scholar
- 49.Imoto M (1990) J Adhes Soc Jpn 26(1):39Google Scholar
- 50.Hata T, Kitazaki T, Saito T (1987) J Adhes 21:177CrossRefGoogle Scholar
- 51.Gledhill RA, Kinloch AJ (1974) J Adhes 6:315CrossRefGoogle Scholar
- 52.Yamabe H (1993) J Adhes Soc Jpn 29(1):12Google Scholar
- 53.Takeda S, Masuko T (2000) Novel die attach films having high reliability performance for lead-free solder and CSP. In: Proceedings of 50th electronic components and technology conference (ECTC), 21–24 May 2000, Las Vegas, p 1616Google Scholar
- 54.Masuko T, Takeda S, Hasegawa Y (2005) J Jpn Inst Electron Packag 8(2):116Google Scholar
- 55.Hsiao SH, Huang PC (1997) J Polym Res 4(3):183CrossRefGoogle Scholar
- 56.Fedors RF (1974) Polym Eng Sci 14(2):147CrossRefGoogle Scholar
- 57.Okitsu T (1996) Secchaku 40(8):342Google Scholar
- 58.Bolger JC (1982) Polyimide adhesives to reduce thermal stress in LSI ceramic packages. In: 14th National SAMPE technology conference, October, pp 257–266Google Scholar
- 59.Yamanaka K, Inoue T (1989) Polymer 30:662CrossRefGoogle Scholar
- 60.Inoue T (1995) Prog Polym Sci 20:119CrossRefGoogle Scholar
- 61.Iwakura T, Inada T, Kader M, Inoue T (2006) J Soft Mater 2:13–19CrossRefGoogle Scholar
- 62.Inada T (2014) Polym J 46:745–750CrossRefGoogle Scholar
- 63.Gou Y, Aoyama Y, Takahara A, Jinnai H, Inoue T (2008) J Netw Polym 29:31Google Scholar
- 64.Dantzig G (1963) Linear programming and extensions. Princeton University Press, PrincetonCrossRefMATHGoogle Scholar
- 65.Inada T, Matsuo T (2012) Int J Multimedia Ubiquitous Eng 7(4):45Google Scholar
- 66.Inada T, Matsuo T (2014) Synthesiology 7(1):1–7CrossRefGoogle Scholar
- 67.Kim J, Lee K, Park D, Hwang T (2008) Application of through mold via (TMV) as PoP base package. In: The proceedings of 58th electronic components and technology conference, pp 1089–1092Google Scholar