A Hybrid Model Combining SOMs with SVRs for Patent Quality Analysis and Classification
Traditional researchers and analyzers have fixated on developing sundry patent quality indicators only, but these indicators do not have further prognosticating power on incipient patent applications or publications. Therefore, the data mining (DM) approaches are employed in this paper to identify and to classify the new patent’s quality in time. An automatic patent quality analysis and classification system, namely SOM-KPCA-SVM, is developed according to patent quality indicators and characteristics, respectively. First, the model will cluster patents published before into different quality groups according to the patent quality indicators and defines group quality type instead of via experts. Then, the support vector machine (SVM) is used to build up the patent quality classification model. The proposed SOM-KPCA-SVM is applied to classify patent quality automatically in patent data of the thin film solar cell. Experimental results show that our proposed system can capture the analysis effectively compared with traditional manpower approach.
KeywordsPatent analysis Patent quality Data clustering Patent quality classification Machine learning
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