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Online Software-Based Self-Testing in the Dark Silicon Era

  • Mohammad-Hashem HaghbayanEmail author
  • Amir M. Rahmani
  • Antonio Miele
  • Pasi Liljeberg
  • Hannu Tenhunen
Chapter

Abstract

Aggressive technology scaling and intensive computations have caused acceleration in the aging and wear-out process of digital systems, hence leading to an increased occurrence of premature permanent faults. Online testing techniques are becoming a necessity in current and near future digital systems. However, state-of-the-art techniques are not aware of the other digital systems’ power/performance requirements that exist in modern multi-/many-core systems. This chapter presents an approach for power-aware non-intrusive online testing in many-core systems. The approach aims at scheduling at runtime Software-Based Self-Test (SBST) routines on the various cores to exploit their idle periods in order to benefit the potentially available power budget and minimize the performance degradation. Furthermore, a criticality metric is used to identify and rank cores that need testing at a time and power and reliability issues related to the testing at different voltage and frequency levels are taken into account. Experimental results show that the proposed approach can (1) efficiently perform cores’ testing, within less than 1 % penalty on system throughput and by dedicating only 2 % of the actual consumed power, (2) adapt to the current stress level of the cores by using the utilization metric, and (3) cover all the voltage and frequency levels during the various tests.

Keywords

Task Graph Power Budget Test Schedule Test Scheduler Online Testing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer International Publishing Switzerland 2017

Authors and Affiliations

  • Mohammad-Hashem Haghbayan
    • 1
    Email author
  • Amir M. Rahmani
    • 1
  • Antonio Miele
    • 2
  • Pasi Liljeberg
    • 1
  • Hannu Tenhunen
    • 3
  1. 1.University of TurkuTurkuFinland
  2. 2.Politecnico di Milano, Dipartimento di ElettronicaInformazione e BioingegneriaMilanItaly
  3. 3.KTH Royal Institute of TechnologyStockholmSweden

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