Soft-Error Aware Power Optimization
Chapter
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Abstract
As technology scaling continues, the leakage or static power consumption of a circuit increases. When designers try to address reduction of static power consumption via optimizations, they need to be aware of the impact on single event robustness. This is especially important for mission critical applications where the reliability is most important objective over the cost and the performance. This chapter hence discusses soft error tolerance of some power optimization techniques.
Keywords
Low power design Radiation tolerance of low power methodologies Dynamic threshold Power optimizationReferences
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