In Situ Nanocharacterization of Yeast Cells Using ESEM and FIB
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Yeast, one of the simplest eukaryotic microorganisms classified in the fungal kingdom, has been widely used in the food industry and as a model organism in medicine and biology. This practical overview describes how functional micro-/nanotools are prepared based on focused ion beam fabrication, assembled on the nanocharacterization system inside the environmental scanning electron microscopy chamber, mounted on the cooling stage, and used for in situ yeast characterization. The concept of this approach is demonstrated by measuring various yeast cell properties, including cell stiffness, cell–substrate adhesion, and cell–cell interaction with the micro-/nanotool as well as in situ single-cell cutting. Finally, the remaining challenges associated with this characterization system and future research directions are discussed.
KeywordsEnvironmental SEM Single-cell analysis FIB Yeast cell Micro-/nanomanipulation Micro-/nanorobot Micro-/nanotool
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