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Test Case Generation for Concurrent Systems Using Event Structures

  • Konstantinos Athanasiou
  • Hernán Ponce-de-León
  • Stefan Schwoon
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 9154)

Abstract

This paper deals with the test-case generation problem for concurrent systems that are specified by true-concurrency models such as Petri nets. We show that using true-concurrency models reduces both the size and the number of test cases needed for achieving certain coverage criteria. We present a test-case generation algorithm based on Petri net unfoldings and a SAT encoding for solving controllability problems in test cases. Finally, we evaluate our algorithm against traditional test-case generation methods under interleaving semantics.

Keywords

Event Structure Test Suite Label Transition System Coverage Criterion System Under Test 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer International Publishing Switzerland 2015

Authors and Affiliations

  • Konstantinos Athanasiou
    • 1
  • Hernán Ponce-de-León
    • 2
  • Stefan Schwoon
    • 3
  1. 1.College of Computer and Information ScienceNortheastern UniversityBostonUSA
  2. 2.Helsinki Institute for Information Technology HIIT and Department of Computer Science and Engineering, School of ScienceAalto UniversityEspooFinland
  3. 3.LSV (École Normale Supérieure de Cachan and CNRS)CachanFrance

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