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Velocity Map Imaging of Electrons Strong-Field Photoemitted from Si-Nanotip Arrays

  • Hong YeEmail author
  • Jens S. Kienitz
  • Shaobo Fang
  • Sebastian Trippel
  • Michael E. Swanwick
  • Phillip D. Keathley
  • Luis F. Velásquez-García
  • Giovanni Cirmi
  • Giulio M. Rossi
  • Arya Fallahi
  • Oliver D. Mücke
  • Jochen Küpper
  • Franz X. Kärtner
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 162)

Abstract

We observe the electron velocity/momentum distributions due to three-photon ionization and strong-field photoemission from Si-nanotip arrays using velocity map imaging.

Keywords

Momentum Distribution Transverse Momentum Distribution Electron Wave Packet Electron Momentum Distribution Schottky Effect 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

The authors like to thank Nele L.M. Müller for many helpful discussion on photocathode emittance measurements.

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Copyright information

© Springer International Publishing Switzerland 2015

Authors and Affiliations

  • Hong Ye
    • 1
    • 2
    Email author
  • Jens S. Kienitz
    • 1
    • 3
  • Shaobo Fang
    • 1
    • 3
  • Sebastian Trippel
    • 1
  • Michael E. Swanwick
    • 4
  • Phillip D. Keathley
    • 5
  • Luis F. Velásquez-García
    • 4
  • Giovanni Cirmi
    • 1
    • 3
  • Giulio M. Rossi
    • 1
    • 2
  • Arya Fallahi
    • 1
    • 3
  • Oliver D. Mücke
    • 1
    • 3
  • Jochen Küpper
    • 1
    • 2
    • 3
  • Franz X. Kärtner
    • 1
    • 2
    • 3
    • 5
  1. 1.Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron DESYHamburgGermany
  2. 2.Department of PhysicsUniversity of HamburgHamburgGermany
  3. 3.The Hamburg Center for Ultrafast ImagingUniversity of HamburgHamburgGermany
  4. 4.Microsystems Technology LaboratoriesMassachusetts Institute of TechnologyCambridgeUSA
  5. 5.Department of Electrical Engineering and Computer Science and Research Laboratory of ElectronicsMassachusetts Institute of TechnologyCambridgeUSA

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