A New Color Image Database TID2013: Innovations and Results

  • Nikolay Ponomarenko
  • Oleg Ieremeiev
  • Vladimir Lukin
  • Lina Jin
  • Karen Egiazarian
  • Jaakko Astola
  • Benoit Vozel
  • Kacem Chehdi
  • Marco Carli
  • Federica Battisti
  • C. -C. Jay Kuo
Part of the Lecture Notes in Computer Science book series (LNCS, volume 8192)

Abstract

A new database of distorted color images called TID2013 is designed and described. In opposite to its predecessor, TID2008, this database contains images with five levels of distortions instead of four used earlier and a larger number of distortion types (24 instead of 17). The need for these modifications is motivated and new types of distortions are briefly considered. Information on experiments already carried out in five countries with the purpose of obtaining mean opinion score (MOS) is presented. Preliminary results of these experiments are given and discussed. Several popular metrics are considered and Spearman rank order correlation coefficients between these metrics and MOS are presented and discussed. Analysis of the obtained results is performed and distortion types difficult for assessment by existing metrics are noted.

Keywords

full reference metrics image visual quality mean opinion score color image database subjective experiments 

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Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  • Nikolay Ponomarenko
    • 1
  • Oleg Ieremeiev
    • 1
  • Vladimir Lukin
    • 1
  • Lina Jin
    • 2
  • Karen Egiazarian
    • 2
  • Jaakko Astola
    • 2
  • Benoit Vozel
    • 3
  • Kacem Chehdi
    • 3
  • Marco Carli
    • 4
  • Federica Battisti
    • 4
  • C. -C. Jay Kuo
    • 5
  1. 1.Dept of Transmitters, Receivers and Signal ProcessingNational Aerospace UniversityKharkovUkraine
  2. 2.Institute of Signal ProcessingTampere University of TechnologyTampereFinland
  3. 3.University of Rennes 1 - IETR, CS 80518Lannion CedexFrance
  4. 4.University of Rome IIIRomeItaly
  5. 5.Media Communications LabUSC Viterbi School of EngineeringUSA

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