Statistical Analysis in Signature Recognition System Based on Levenshtein Distance
In this paper we develop our previously presented studies, where adaptation of the Levenshtein method in a signature recognition process is proposed. Three methods based on the normalized Levenshtein measure were taken into consideration. The studies included an analysis and selection of appropriate signature features, on the basis of which the authenticity of a signature was verified later. A statistical apparatus was used to perform a comprehensive analysis. Results obrained were tested by means of χ 2 independence test. It allowed determining the relationship between signature features and the errors of classifier.
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