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Statistical Analysis in Signature Recognition System Based on Levenshtein Distance

  • Malgorzata PalysEmail author
  • Rafal Doroz
  • Piotr Porwik
Part of the Advances in Intelligent Systems and Computing book series (AISC, volume 226)

Abstract

In this paper we develop our previously presented studies, where adaptation of the Levenshtein method in a signature recognition process is proposed. Three methods based on the normalized Levenshtein measure were taken into consideration. The studies included an analysis and selection of appropriate signature features, on the basis of which the authenticity of a signature was verified later. A statistical apparatus was used to perform a comprehensive analysis. Results obrained were tested by means of χ 2 independence test. It allowed determining the relationship between signature features and the errors of classifier.

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Copyright information

© Springer International Publishing Switzerland 2013

Authors and Affiliations

  1. 1.Institute of Computer ScienceUniversity of SilesiaSosnowiecPoland

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