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Optical Correction of X-Ray Laser Illumination for Short-Wavelength Microscopy

  • Mabel Ruiz-Lopez
  • Felix Staub
  • Davide Bleiner
Part of the Springer Proceedings in Physics book series (SPPHY, volume 147)

Abstract

A critical aspect in the design of a short-wavelength microscope is the illumination profile and stability. Experimental measurements of the pointing stability and divergence and optical corrections of X-ray laser source are shown. The optical corrections provided one order of magnitude improvement in the illumination performance.

Keywords

Curve Mirror Image Optical Correction Phosphor Screen Source Profile Pulse Position 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

The present work was supported by the Swiss National Science Foundation under the grant number PP00P2-133564/1.

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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.Institute of Applied PhysicsUniversity of BernBernSwitzerland

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