Optical Correction of X-Ray Laser Illumination for Short-Wavelength Microscopy

Part of the Springer Proceedings in Physics book series (SPPHY, volume 147)

Abstract

A critical aspect in the design of a short-wavelength microscope is the illumination profile and stability. Experimental measurements of the pointing stability and divergence and optical corrections of X-ray laser source are shown. The optical corrections provided one order of magnitude improvement in the illumination performance.

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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.Institute of Applied PhysicsUniversity of BernBernSwitzerland

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