Optical Correction of X-Ray Laser Illumination for Short-Wavelength Microscopy
A critical aspect in the design of a short-wavelength microscope is the illumination profile and stability. Experimental measurements of the pointing stability and divergence and optical corrections of X-ray laser source are shown. The optical corrections provided one order of magnitude improvement in the illumination performance.
KeywordsCurve Mirror Image Optical Correction Phosphor Screen Source Profile Pulse Position
The present work was supported by the Swiss National Science Foundation under the grant number PP00P2-133564/1.