Optical Correction of X-Ray Laser Illumination for Short-Wavelength Microscopy

  • Mabel Ruiz-Lopez
  • Felix Staub
  • Davide Bleiner
Part of the Springer Proceedings in Physics book series (SPPHY, volume 147)


A critical aspect in the design of a short-wavelength microscope is the illumination profile and stability. Experimental measurements of the pointing stability and divergence and optical corrections of X-ray laser source are shown. The optical corrections provided one order of magnitude improvement in the illumination performance.


Curve Mirror Image Optical Correction Phosphor Screen Source Profile Pulse Position 
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The present work was supported by the Swiss National Science Foundation under the grant number PP00P2-133564/1.


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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.Institute of Applied PhysicsUniversity of BernBernSwitzerland

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