Abstract
Improving the energy efficiency of processor systems-on-chip (SoCs) is key to improving their performance and utility. The FD-SOI silicon process enables integrated systems that can deliver dramatic improvements in energy efficiency through system integration. This chapter presents the Raven-3 and Raven-4 testchips, fully integrated and fully featured SoCs which achieve energy-efficient operation with low overhead. RISC-V processors allow for innovation and experimentation in the context of a free, open architecture. Integrated switched-capacitor voltage regulators can achieve high conversion efficiency when coupled with adaptive clock generators. Custom SRAM macros operate at low supply voltages, enabling wide voltage scaling. An integrated body-bias generator allows run-time tuning of threshold voltage for improved performance or reduced leakage. Taken together, these innovations showcase the possibilities of FD-SOI technology.
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Acknowledgements
Fabrication of the Raven-3 and Raven-4 testchips was donated by STMicroelectronics. The research presented in this chapter was supported by the Berkeley Wireless Research Center, the Berkeley ASPIRE Lab, DARPA PERFECT Award Number HR0011-12-2-0016, Intel ARO, AMD, SRC/TxACE, Marie Curie FP7, the NSF GRFP, and the NVIDIA Fellowship.
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Keller, B. et al. (2020). System Integration of RISC-V Processors with FD-SOI. In: Clerc, S., Di Gilio, T., Cathelin, A. (eds) The Fourth Terminal. Integrated Circuits and Systems. Springer, Cham. https://doi.org/10.1007/978-3-030-39496-7_11
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