The Transmission Electron Microscope

  • Earl J. Kirkland


This chapter gives a short description of the physical instrumentation of the transmission electron microscope (fixed beam and scanned probe modes). It starts with the fundamental physics of electron dynamics for energies in the range 60–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are discussed. Various approximations used in modeling the microscope are introduced. Optical aberrations are defined, and general methods of aberration correction are described briefly.


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© Springer Nature Switzerland AG 2020

Authors and Affiliations

  • Earl J. Kirkland
    • 1
  1. 1.School of Applied & Engineering PhysicsCornell UniversityIthacaUSA

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