Sparse (P)MOR for Electro-Thermal Coupled Problems with Many Inputs
This chapter reviews the recently proposed (parametric) model order reduction methods for electro-thermal (ET) coupled problems with many inputs, arising from (nano-)microelectronic simulation. For non-parametric problems, we discuss the block-diagonal structured model order reduction (MOR) methods (BDSM-ET) proposed in [6, 7]. For parametric problems, we discuss the parametric MOR method for ET coupled problems with many inputs (IpBDSM-ET) proposed in . By construction, these methods lead to sparse reduced-order models (ROMs) and their efficiency is demonstrated using (non-)parametric ET coupled problems from industrial applications.
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