A Performance Comparison of Fuzzy Logic Based Truly Random Number Generator with Other Low Power LFSR Architectures

  • G. Sathesh KumarEmail author
  • V. Saminadan
Conference paper
Part of the Lecture Notes on Data Engineering and Communications Technologies book series (LNDECT, volume 26)


This paper propose a new test pattern generation approach that can generate test patterns with high randomness as well with lowest possible power consumption. This paper also compares the proposed approach with the traditional LFSR structures such as bit swapping LFSR and cellular automata based LFSR. The experimental results prove that the fuzzy logic based random number generation approach is more suitable for testing of highly complex digital circuits.


Bit swapping LFSR Built-in self test Cellular automata Random number generation Ring based oscillator 


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© Springer Nature Switzerland AG 2019

Authors and Affiliations

  1. 1.Department of ECEPondicherry Engineering CollegePuducherryIndia

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