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A Performance Comparison of Fuzzy Logic Based Truly Random Number Generator with Other Low Power LFSR Architectures

  • G. Sathesh KumarEmail author
  • V. Saminadan
Conference paper
Part of the Lecture Notes on Data Engineering and Communications Technologies book series (LNDECT, volume 26)

Abstract

This paper propose a new test pattern generation approach that can generate test patterns with high randomness as well with lowest possible power consumption. This paper also compares the proposed approach with the traditional LFSR structures such as bit swapping LFSR and cellular automata based LFSR. The experimental results prove that the fuzzy logic based random number generation approach is more suitable for testing of highly complex digital circuits.

Keywords

Bit swapping LFSR Built-in self test Cellular automata Random number generation Ring based oscillator 

References

  1. 1.
    Abramovici, M., Breuer, M.A., Friedman, A.D.: Digital Systems Testing and Testable Design. Jaico Publishing House, India (2006)Google Scholar
  2. 2.
    Weste, N.H.E., Eshraghian, K.: Principles of CMOS VLSI Design- A System Perspective, 2nd edn. Addison Wesley, Boston (1994)Google Scholar
  3. 3.
    Jessa, M., Matuszewski, L.: Enhancing the randomness of a combined true random number generator based on the ring oscillator sampling method. In: 2011 International Conference on Reconfigurable Computing and FPGAs (ReConFig), Cancun, November 30–December 2, 2011, pp. 274–279 (2011)Google Scholar
  4. 4.
    Petrie, C.S., Connelly, J.A.: Modeling and simulation of oscillator-based random number generators. In: Proceedings of the IEEE International Symposium Circuits System (ISCAS), pp. 324–327, May 1996Google Scholar
  5. 5.
    Hortensius, P.D., Mcleod, R.D., Pries, W., Michael Miller, D., Card, H.C.: Cellular automata-based pseudo random number generators for Built-in self test. IEEE Trans. Comput. Aided Des. 8(8), August 1989CrossRefGoogle Scholar
  6. 6.
    Nithya, R., Paviya, M., Poornimadevi, A., Ravi, S.: A performance comparison of low power LFSR structures. Int. J. Recent. Res. Sci. Eng. Technol. 1(1), April 2015Google Scholar
  7. 7.
    Abu-Issa, A.S., Quigley, S.F.: Bit-swapping LFSR for low-power BIST. Electron. Lett. 44(6), 401–402 (2008)CrossRefGoogle Scholar
  8. 8.
    Bhaskar, P., Arulmurugan, A.: Survey of low power testing of vlsi circuits. In: EEE International Conference on Computer Communication and Informatics (ICCCI-2012), 10–12 January, 2012, Coimbatore, India (2012)Google Scholar

Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  1. 1.Department of ECEPondicherry Engineering CollegePuducherryIndia

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