High-Speed Electron Microscopy

  • Geoffrey H. CampbellEmail author
  • Joseph T. McKeown
  • Melissa K. Santala
Part of the Springer Handbooks book series (SHB)


High-speed electron microscopy has emerged as a well-established in situ transmission electron microscopy () capability that can provide observations and measurements of complex, transient materials phenomena with high spatial and temporal resolutions. The development and advancement of the two categories of high-speed electron microscopy, each optimized for specific regimes of spatial and temporal resolutions—single-shot dynamic TEM () and stroboscopic or ultrafast TEM ()—are reviewed and the technologies employed in both techniques are described. Limitations of the techniques are described and example applications are provided. Finally, an outlook for future development of time-resolved electron microscopy is provided, offering potential directions for new levels of performance and flexibility.



This work was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory (LLNL) under Contract No. DE-AC52-07NA27344. Activities and personnel at LLNL were supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Division of Materials Science and Engineering under FWP SCW0974.


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© Springer Nature Switzerland AG 2019

Authors and Affiliations

  1. 1.Materials Science DivisionLawrence Livermore National LaboratoryLivermore, CAUSA
  2. 2.Materials Science DivisionLawrence Livermore National LaboratoryLivermore, CAUSA
  3. 3.School of Mechanical, Industrial, and Manufacturing EngineeringOregon State UniversityCorvallis, ORUSA

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