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Scanning Electron Microscopy

  • Natasha Erdman
  • David C. BellEmail author
  • Rudolf Reichelt
Chapter
Part of the Springer Handbooks book series (SHB)

Abstract

This chapter provides an overview of the concepts of scanning electron microscopy () from a theoretical as well as practical operational perspective. The theory section begins with the basics of image formation followed by an explanation of the interaction of the electron beam with the sample. A description of the different types of electron guns is also included. The concepts involved with image formation from a rastered (or scanned) electron beam on a surface is explained along with the mechanisms of contrast generation from sample surface topography and sample composition. The different SEM detectors are also explained including a description of the practical application of detectors under various sample conditions. Numerous diagrams and figures in this chapter illustrate imaging geometries and possible SEM system configurations. Included in the chapter is an explanation of the various instrument operation parameters for different samples as well as a discussion of the effects of electron-beam accelerating voltages on sample imaging, contrast, and resolution.

More advanced topics are also included such as the use of beam deceleration and in-lens imaging and detectors. Analytical SEM techniques are also explained with the explanation of the use of energy-dispersive x-ray detectors (EDS) used to measure sample composition as well as provide compositional maps of a sample. Application of SEM to a variety of materials systems under varying conditions are discussed with multiple examples and illustrations given.

scanning electron microscope (SEM) energy dispersive spectroscopy (EDS) variable pressure (VP) secondary electrons backscatter electrons 

Notes

Acknowledgements

In the contribution in Science of Microscopy, on which this chapter is based, the late Professor Reichelt thanked Dipl.-Ing. Harald Nüsse (artwork), Dr. Vladislav Kryzanek (Monte Carlo simulations of scattering in thin and bulk specimens), Mrs. Ulrike Keller (scanning electron microscope expertise) and Mrs. Gudrun Kiefermann (photography), all of the Institut für Medizinische Physik und Biophysik of the University of Münster, for very welcome help. The chapter was dedicated to his wife Doris and his daughter Hanna. D.C.B. and N.E., who have undertaken the revision of the earlier text, would like to thank Mr. Masateru Shibata (JEOL USA) for his kind help with some of the illustrations in this chapter. D.C.B. and N.E. would like to dedicate it to Campbell, Angus, and Gideon.

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Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  • Natasha Erdman
    • 1
  • David C. Bell
    • 2
    Email author
  • Rudolf Reichelt
    • 3
  1. 1.JEOL USA Inc.Peabody, MAUSA
  2. 2.Center for Nanoscale SystemsHarvard UniversityCambridge, MAUSA
  3. 3.Abberior Instruments GmbHGöttingenGermany

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