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Trace Analysis by SEM/EDS

  • Joseph I. Goldstein
  • Dale E. Newbury
  • Joseph R. Michael
  • Nicholas W. M. Ritchie
  • John Henry J. Scott
  • David C. Joy
Chapter

Abstract

«Trace analysis” refers to the measurement of constituents presents at low fractional levels. For SEM/EDS the following arbitrary but practical definitions have been chosen to designate various constituent classes according to these mass concentration (C) ranges:

References

  1. Currie LA (1968) Limits for qualitative detection and quantitative determination. Anal Chem 40:586–593CrossRefGoogle Scholar
  2. Newbury DE, Ritchie NWM (2016) Measurement of trace constituents by electron-excited X-ray microanalysis with energy dispersive spectrometry. Micros Microanal 22(3):520–535CrossRefGoogle Scholar
  3. Williams DB, Goldstein JI (1981) Artifacts encountered in energy dispersive X-ray spectrometry in the analytical electron microscope. In: Heinrich KFJ, Newbury DE, Myklebust RL, Fiori CE (eds) Energy dispersive X-ray spectrometry, National Bureau of Standards Special Publication 604 (U.S. Department of Commerce, Washington, DC), pp 341–349Google Scholar

Copyright information

© Springer Science+Business Media LLC 2018

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Authors and Affiliations

  • Joseph I. Goldstein
    • 1
  • Dale E. Newbury
    • 2
  • Joseph R. Michael
    • 3
  • Nicholas W. M. Ritchie
    • 2
  • John Henry J. Scott
    • 2
  • David C. Joy
    • 4
  1. 1.University of MassachusettsAmherstUSA
  2. 2.National Institute of Standards and TechnologyGaithersburgUSA
  3. 3.Sandia National LaboratoriesAlbuquerqueUSA
  4. 4.University of TennesseeKnoxvilleUSA

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