Trace Analysis by SEM/EDS
«Trace analysis” refers to the measurement of constituents presents at low fractional levels. For SEM/EDS the following arbitrary but practical definitions have been chosen to designate various constituent classes according to these mass concentration (C) ranges:
- Williams DB, Goldstein JI (1981) Artifacts encountered in energy dispersive X-ray spectrometry in the analytical electron microscope. In: Heinrich KFJ, Newbury DE, Myklebust RL, Fiori CE (eds) Energy dispersive X-ray spectrometry, National Bureau of Standards Special Publication 604 (U.S. Department of Commerce, Washington, DC), pp 341–349Google Scholar
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 2.5 International License (http://creativecommons.org/licenses/by-nc/2.5/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.
The images or other third party material in this chapter are included in the chapter's Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the chapter's Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder.