Advanced Transmission Electron Microscopy pp 231-295 | Cite as
Instrumentation and Experimental Techniques
Chapter
First Online:
Abstract
Many of the instrumental requirements for electron diffraction, particularly the needs for small electron probes, will be found to be similar to those for analytical electron microscopy.
Keywords
Magnetic Sector Convergence Angle Energy Filter Focus Probe Condenser Lens
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
References
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