Abstract
One of the most important signal specifications for an oscillation is its spectral purity. In every oscillator application there is a limit on the noise that can be allowed to contaminate the oscillation. Therefore this, and the following two chapters are devoted to noise. In this chapter, general descriptions are given of the influence of noise on oscillations. Section 4.2 starts with a mathematical description of contaminations of oscillations. Section 4.3 specifically zooms in on the noise behavior of oscillators. In this section, the mathematical fundamentals of Section 4.2 are used as a basis. In the five subsections of Section 4.3, various noise measures are presented that are often used in literature. Some of these noise measures can effectively describe the noise behavior whereas others should be avoided. Using the results of the subsections describing the various noise measures, the results from the rest of the chapter can be compared to results already known from literature. In the last section, the Bennet model is introduced. This model can be used advantageously for noise calculations in oscillators. In Chapter 5, this model is used for the description of the influence of noise in first-order oscillators.
Keywords
Noise Measure Phase Noise Noise Source Noise Spectrum Spectral PurityPreview
Unable to display preview. Download preview PDF.
Bibliography
- [1]A.A. Abidi. How phase noise appears in oscillators. Proceeding of the Workshop on Advances in Analog Circuit Design, AACD 1997, Como, Italy.Google Scholar
- [2]A.A. Abidi and R.G. Meyer. Noise in relaxation oscillators. IEEE Journal of Solid State Circuits, vol. 18, pp. 794–802, 1983.CrossRefGoogle Scholar
- [3]J.A Barnes, A.R. Chi, L.S. Cutler, D.J. Healey, D.B. Leeson, T.E. McGunigal, J.A. Mullen jr., W.L. Smith, R.L. Sydnor, R.F.C. Vessot, and G.M.R. Winkler. Characterization of frequency stability. IEEE Transactions on Intrumentation and Measurement, vol. 20, no. 2, pp. 105–120, 1971.CrossRefGoogle Scholar
- [4]C.A.M. Boon. Design of High-Performance Negative-Feedback Oscillators. PhD thesis, Delft University of Technology, 1989.Google Scholar
- [5]J. Brown and E.V.D. Glazier. Telecommunications. Chapman and Hall, 1966.Google Scholar
- [6]A. Bruce Carlson. Communication systems. McGraw-Hill international editions, 1986.Google Scholar
- [7]L.S. Cutler and C.L. Searle. Some aspects of the theory and measurement of frequency fluctuations in frequency standards. Proceedings of the IEEE, vol. 54, no. 2, pp. 136–154, 1966.CrossRefGoogle Scholar
- [8]W.A. Edson. Noise in oscillators. Proceedings of the IRE, vol. 48, pp. 1454–1466, 1960.CrossRefGoogle Scholar
- [9]E.S. Ferre-Pikal, J.R. Vig, J.C. Camparo, L.S. Cutler, L. Maleki, W.J. Riley, S.R. Stein, C. Thomas, F.L. Walls, and J.D. White. Draft revision of ieee std 1139–1988 standard definitions of physical qunatities for fundamental frequency and time metrology — random instabilities. Proceedings of the 1997 IEEE International Frequency Control Symposium, pages 338–357, 1997.Google Scholar
- [10]A. Hajimiri and T.H. Lee. A general theory of phase noise in electrical oscillators. IEEE Journal of Solid State Circuits, vol. 33, no. 2, pp. 179–194, 1998.CrossRefGoogle Scholar
- [11]D.B. Leeson. A simple model of feedback oscillator noise spectrum. Proceedings of the IEEE, vol. 54, pp. 329–330, 1966.CrossRefGoogle Scholar
- [12]H.C. Nauta. Fundamental aspects and design of monolithically integrated AM radio receivers. PhD thesis, Delft University of Technology, 1986.Google Scholar
- [13]B. Razavi. A study of phase noise in CMOS oscillators. IEEE Journal of Solid State Circuits, vol. 31, no. 3, pp. 331–343, 1996.CrossRefGoogle Scholar
- [14]J. Rutman. Characterization of phase and frequency instabilities in precision frequency sources. Proceedings of the IEEE, vol. 66, no. 9, pp. 1048–1076, 1978.CrossRefGoogle Scholar
- [15]A. Sempel and H. van Nieuwenburg. A fully-integrated HIFI PLL FM-demodulator. ISSCC 1990, pp. 102–103.Google Scholar
- [16]F.L. Walls and D.W. Allan. Measurements of frequency stability. Proceedings of the IEEE, pages 162–168, 1986.Google Scholar