Acoustoelectric Characterization of Wide Gap II-VI Semiconductors in the Case of Bipolar Photoconduction
Chapter
Abstract
The purpose of the present article is to demonstrate that acousto-electric methods may be used to characterize piezoelectric semiconductors in the case of bipolar photoconduction. The wide gap II–VI semiconductor CdTe is used as an example for this characterization method.
Keywords
Generation Rate Sound Wave Hall Effect Applied Electric Field Inversion Point
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References
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© Plenum Press, New York 1989