X-Ray Diffraction Microscopy

  • R. W. Armstrong
  • C. Cm. Wu
Chapter

Abstract

The individual diffraction spots which are obtained in single crystal transmission or back-reflection x-ray patterns contain a fine structure that can be matched on a point by point basis with the crystal surface appearance and with the internal strain pattern of the underlaying crystal volume. Barrett (1) pointed this out for individual diffraction spots resulting from Laue (transmission) x-ray patterns. Figure 1 indicates the first step which might be taken to further investigate the inner structure of individual diffraction spots, say, as are obtained in a back-reflection photograph of a zinc single crystal. Berg (2) independently demonstrated that detailed structural information could be obtained from an x-ray spot by utilizing a single lattice reflection which satisfied the Bragg equation for characteristic x-radiation under conditions such that very good resolution resulted for the x-ray (back-reflection) picture of the diffracting crystal. This involved placing the crystal at a relatively large distance from the x-ray source so as to achieve a small divergence of x-rays satisfying the Bragg condition and, then, recording the diffracted x-ray intensity at a small distance from the crystal surface so as to minimize the spreading of the x-ray intensity diffracted from any point within the crystal volume. Barrett (3) further demonstrated the potential of this new microscopy in his presentation of the twenty-fourth annual lecture of the Institute of Metals Division of the AIME. For the back reflection geometry, an enhanced x-ray intensity was observed to be diffracted from mildly strained regions of the crystal. Barrett attributed the enhanced intensity to be due both to the greater angular range of x-rays able to be diffracted from a locally strained volume and to the thicker crystal layer able to diffract x-rays if it contains local strains. Near to the time of this latter work by Barrett, quite the reverse x-ray result was found by Borrmann (4) in that an anomalously large x-ray intensity was observed to be transmitted through relatively thick crystals satisfying the (Laue) diffraction condition so long as the crystals were very nearly perfect. Anomalous transmission was said to occur when a transmitted x-ray intensity was detected of magnitude far in excess of that expected from the normal attenuation of the beam due to absorption processes. Thus, anomalous transmission may occur for a transmitted x-ray beam when the product of the crystal absorption coefficient, μ times the crystal thickness, t, is much greater than 1. 0. This property of very nearly perfect crystals being able to anomalously transmit x-rays is explained within the framework of the dynamical theory of x-ray diffraction as given, for example, by von Laue (5).

Keywords

Silicon Crystal Gallium Arsenide Subgrain Boundary Soviet Phys Individual Dislocation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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Copyright information

© Plenum Press, New York 1973

Authors and Affiliations

  • R. W. Armstrong
    • 1
  • C. Cm. Wu
    • 1
  1. 1.University of MarylandCollege ParkUSA

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