About the Effects of the Movements of the Critical Reflecting Layer on Swept Reflectometric Measurements
Chapter
Abstract
The impact of density fluctuations on reflectometry measurements has been studied extensively and is still matter of discussion. Detailed numerical models [1–4] (either in WKB or full-wave simulations, I-D and 2-D) gave insight on many effects that the fluctuations may cause to the reflectometric measurements. However some fundamental requirements which have to be taken into account in designing swept reflectometric systems can be recovered from a simple ID model with analytical considerations.
Keywords
Sweep Rate Density Fluctuation Heterodyne Detection Homodyne Detection Abel Inversion
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