Geometry and Thermodynamics pp 89-107 | Cite as
Electron Microscopy and Quasicrystals
Abstract
Since the discovery by D. Shechtman of the icosahedral AlMn phase by electron diffraction, a number of investigation techniques commonly used in materials science have been applied to the case of quasicrystals, like X-rays and neutron diffraction and local spectroscopies. But indisputably the understanding of their structure has been driven by electron microscopy. The major reason for that is due to the fact that quasicrystals are generally of micronic size, when obtained for example by rapid solidification, but also coexisting, at a more or less fine scale, with other intermetallic crystalline compounds; this last point hampers evidently characterization techniques with limited spatial resolution which sample the alloys at a heterogeneous scale or which requires a large amount of matter.
Keywords
Select Area Diffraction Pattern Antiphase Boundary Fibonacci Sequence Hypercubic Lattice Laue ZonePreview
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References
- (1).D. Shechtman, I. Blech, D. Gratias and J.W. Cahn, Phys. Rev. Lett., 53, 1951 (1984).CrossRefGoogle Scholar
- (2).K. Hiraga, B.P. Zhang, M. Hirabayashi, A. Inoue and T. Masumoto, Jap. J. of Appl. Phys., 27, L951 (1988).CrossRefGoogle Scholar
- (3).K. Hiraga, M. Hirabayashi, A. Inoue and T. Masumoto, Sc. Rep. of Res. Inst., Tohoku Univ., A32, 2309 (1985).Google Scholar
- (4).R. Portier, D. Shechtman, D. Gratias and J.W. Cahn, J. Microsc. Spectrosc. El., 10, 107 (1985).Google Scholar
- (5).M. Audier and P. Guyot, Phil. Mag. B, 53, L43 (1986).CrossRefGoogle Scholar
- (6).A. Katz and M. Duneau, J. Phys., 47, 181 (1986).CrossRefGoogle Scholar
- (7).L. Bendersky, Phys. Rev. Lett., 55, 1461 (1985).CrossRefGoogle Scholar
- (8).P. Guyot and M. Audier, J. Microsc. Spectrosc. El., 10, 333 (1985).Google Scholar
- (9).N. Wang, H. Chen and K. Kuo, Phys. Rev. Lett., 59, 1010 (1987).CrossRefGoogle Scholar
- (10).T. Ishimasa, H.U. Nissen and Y. Fukano, Phys. Rev. Lett., 55, 511 (1985).CrossRefGoogle Scholar
- (11).P. Bak, Phys. Rev. Lett., 54, 1517 (1985); Phys. Rev. B, 32, 5764 (1985).CrossRefGoogle Scholar
- (11).Phys. Rev. B, 32, 5764 (1985).CrossRefGoogle Scholar
- (12).T. Janssen, Acta Crystallogr., A, 42, 261 (1986).CrossRefGoogle Scholar
- (13).T. Janssen and A. Janner, Adv. Phys., 36, 519 (1987).CrossRefGoogle Scholar
- (14).M. Cornier-Quiquandon, Thesis, Paris (1988).Google Scholar
- (15).D. Broddin, G. Van Tanderloo, J. Van Landuyt, S. Amelinckx, R. Portier, M. Guymont and A. Loiseau, Phil. Mag. A, 54, 395 (1986).CrossRefGoogle Scholar
- (16).J. Van Landuyt, G. Van Tendeloo and S. Amelinckx, Mat. Sc. Forum, 22–24, 115 (1987).Google Scholar
- (17).L.X. He, X.Z. Li, Z. Zhang and K.H. Kuo, Phys. Rev. Lett., 61. 1116 (1988).CrossRefGoogle Scholar
- (18).K. Chattopadhyay, S. Lele, N. Thangaraj and S. Ranganathan, Acta Metall., 35, 727 (1987).CrossRefGoogle Scholar
- (19).M. Van Sande, R. de Ridder, J. Van Landuyt and S. Amelinckx, Phys. Stat. Sol., a), 50, 587 (1978).CrossRefGoogle Scholar
- (20).J.W. Cahn and D. Gratias, J. de Phys. Coll. C3, 47, 415 (1986).Google Scholar
- (21).A. Yamamoto and K. Hiraga, Phys.Rev. B, 37, 6207 (1988).CrossRefGoogle Scholar
- (22).P. Guyot, M. Audier and R. Lequette, J. de Phys. Coll. C3, 47, 389 (1986).Google Scholar
- (23).P. Guyot, M. Audier and M. de Boissieu, Third Int. Meeting on Quasi-crystals, Incommensurate Structures in Condensed Matter, Mexico (1989), to be published.Google Scholar
- (24).M. Hirabayashi, K. Hiraga, D. Shindo and T.B. Williams, ibid (23).Google Scholar
- (25).M. Audier, P. Sainfort and B. Dubost, Phil. Mag. B, 54. L10S (1986).CrossRefGoogle Scholar
- (26).K.M. Knowles, Quasicrystalline Materials, World Scientific Ed., 158 (1988).Google Scholar
- (27).M. Audier and P. Guyot, Acta Metall., 36, 1321 (1988).CrossRefGoogle Scholar
- (28).M. Audier and P. Guyot, Quasicrystals AAR Conf., ICTP, Trieste (1989), to be published.Google Scholar
- (29).P. Sainfort and P. Guyot, Scripta Metall., 21, 1517 (1987).CrossRefGoogle Scholar
- (30).D. Shindo, K. Hiraga, T. Williams, M. Hirabayashi, A. Inoue and T. Masurnoto, Jap. J. of Appl. Phys., 28, L688 (1989).CrossRefGoogle Scholar
- (31).J.E. Socolar, T.C. Lubensky and P.J. Steinhardt, Phys. Rev. B, 34, 3345 (1986).CrossRefGoogle Scholar
- (32).P.L. Kalugin, A. Kitayev and L.S. Levitov, J. Phys. Lett. Paris, 46, 601 (1985).CrossRefGoogle Scholar
- (33).K. Hiraga and M. Hirabayashi, J. Electron Microsc, 36, 353 (1987).Google Scholar
- (34).K. Hiraga and M. Hirabayashi, Jap. J. of Appl. Phys., 26, L155 (1987).CrossRefGoogle Scholar
- (35).D.N. Wang, T. Ishimasa, H.U. Nissen, S. Hovmoller and J. Rhyner, Phil. Mag. A, 58, 737 (1988).CrossRefGoogle Scholar
- (36).J. Devaud-Rzepski, M. Cornier-Quiquandon and D. Gratias, ibid (23).Google Scholar
- (37).S. Ebalard and F. Spaepen, to appear in J. Mat. Res.Google Scholar
- (38).J.W. Cahn, D. Shechtman and D. Gratias, J. Mat. Res., i, 13 (1986).CrossRefGoogle Scholar
- (39).J. Devaud-Rezpski, A. Quivy, Y. Calvayrac, M. Cornier-Quiquandon and D. Gratias, Phil. Mag., to be published.Google Scholar
- (40).M. Audier and P. Guyot, Suppl. to Trans. JIM, 29, 467 (1988).Google Scholar
- (41).D.S Zhou, H.Q. Ye, D.X. Li and K.H. Kuo, Phys. Rev. Lett., 60, 2180 (1988).CrossRefGoogle Scholar
- (42).S. Garçon, DEA Metallurgie, Grenoble Univ. (1987).Google Scholar
- (43).M. Audier, P. Guyot and Y. Brechet, submitted to Nature.Google Scholar
- (44).O. Ohashi and F. Spaepen, Nature, 330, 555 (1987).CrossRefGoogle Scholar
- (45).B. Dubost, J.M. Lang, M. Tanaka, P. Sainfort and M. Audier, Nature, 324, 48 (1986).CrossRefGoogle Scholar
- (46).A.P. Tsai, A. Inoue and T. Matsumoto, Jap. J. of Appl. Phys., 26, L1505 (1987).CrossRefGoogle Scholar
- (47).K. Hiraga, M. Hirabayashi, A. Inoue and T. Matsumoto, J. of Microscopy, 146, 245 (1986).CrossRefGoogle Scholar