Neural Network Parallel Computing pp 119-131 | Cite as
Spare Allocation Problems
Abstract
A parallel algorithm for spare allocation problems is introduced in this Chapter. In manufacturing memory chips, the Redundant Random Access Memory (RRAM) technology has been widely used because it not only provides the repairability of faulty cells but also enhances the production yield. RRAM has several rows and columns of spare memory cells which are used to replace the faulty cells. The goal of our algorithm is to find a spare allocation which repairs all the faulty cells in the given faulty cell map. The proposed parallel algorithm requires 2n processing elements for the n×n faulty cell map problem. The algorithm is verified by a large number of simulation runs. Under the simulation the algorithm finds one of the near- optimum solutions in a nearly constant time with O(n) processors. This Chapter is based on a paper published in IEEE Trans, on Reliability (Funabiki and Takefuji 1991).
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