Frequency Measurement and Control pp 322-335 | Cite as
Bibliography
Chapter
Abstract
An exhaustive bibliography of the published literature on the topics covered in this book would consist of thousands of references. It would include fundamental publications as well as short conference proceedings, original papers and ‘letters to the editor’. Such material would be generally incomprehensible to all except for a few specialists. It would also suffer from a high degree of duplication or even triplication. We have tried to overcome this problem by judicious selection from bibliographic information. We begin with standard monographs on the measurement of time and frequency.
Keywords
Phase Noise Frequency Stability Flicker Noise Quartz Crystal Resonator Phase Noise Measurement
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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General Bibliography
- Gerber, E.A. and Ballato, A. (1985) Precision Frequency Control, 2 vols., Academic Press, New York.Google Scholar
- Kartaschoff, P. (1983) Frequency and Time, Academic Press, New York.Google Scholar
- Kroupa, V.F. (1983) Frequency stability: fundamentals and measurements, IEEE Press, New York.Google Scholar
- Blair, B.E. (1974) Time and frequency: Theory and Fundamentals, NBS monograph.Google Scholar
- Chaleat, R. and Haag, J (1960) Problèmes de chrométries et de théorie générale des oscillations, Gauthier Villars, Paris.Google Scholar
- Vanier, J. and Audoin, C (1989) The Quantum Physics of Atomic Frequency Standards, 2 vols., Adam Hilger, Bristol.CrossRefGoogle Scholar
- IEEE Proceedings vol. 54, February 1966 vol. 55, June 1967 vol. 60, May 1972 vol. 74, January 1986Google Scholar
- IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control vol. 34 — November 1977Google Scholar
- Proceedings of the Annual Frequency Control Symposium, organised by US Army Electronics Command, Ft. Monmouth, N.J.(USA)Google Scholar
- National Technical Information Service (NTIS), Sills Buildings, 5285 Post Royal Road, Springfield, Virginia 22161 (since 1973)Google Scholar
- Electronic Industries Association (EIAC), c/o Frequency Control Symposium, 2001 Eye Street, Washington DC20006 (1978 and 1983)Google Scholar
- Institute of Electrical and Electronic Engineers (IEEE), 445 Hoes Lane, Piscataway, N.J. 08854 (since 1983)Google Scholar
- Proceedings of Conference on Precision Electromagnetic Measurements (CPEM), organised annually after I960 by NBS (NIST), available from IEEEGoogle Scholar
- Proceedings of the Annual Precise Time and Time Interval (PTTI) Applications and Planning Meeting Proceedings, available from US Naval Observatory, Washington, DCGoogle Scholar
- Proceedings of the European Frequency and Time Forum, organised annually in France and Switzerland since 1987Google Scholar
- in France: LPMO-CNRS, 32 avenue de l’Observatoire — 25000 BesançonGoogle Scholar
- in Switzerland: F.S.R.M. 8 rue de l’Orangerie, CH-2000 NeuchâtelGoogle Scholar
- Proceedings of l’Union Radioscientifique Internationale, available from URSI, BrusselsGoogle Scholar
- NBS Technical Note 394–1970, Barnes, J.A., Chi, A.R. and Cutler, L.S., Characterization of Frequency Stability Google Scholar
- NBS Technical Note 616-R, March 1974, Frequency Standards and Clocks: A Tutorial Introduction Google Scholar
- NBS Technical Note 632, January 1973, Shoaf, J.H. Haiford, D. and Rusley, A.S., Frequency Stability specifications and measurement: high frequency and microwave signals Google Scholar
- NBS Technical Note 662, February 1975, Hellwig H., A review of precision oscillators Google Scholar
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- NBS Technical Note 679, March 1976. Howe, D.A., Frequency Domain Stability Measurements: A Tutorial Introduction Google Scholar
- NBS Technical Note 683, August 1976, Barnes, J.A., Models for the Interpretation of Frequency Stability Measurements Google Scholar
- NIST Technical Note 1337, Characterisation of Clocks and Oscillators, edited by D.B. Sullivan, D.W. Allan, D.A. Howe, and F.I. Walls, Time and Frequency Division, NIST, Boulder, Colerado 80303-3328Google Scholar
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© Springer Science+Business Media Dordrecht 1994