Electron Microscopy of Nanotubes pp 191-205 | Cite as
In-Situ Field Emission of Carbon Nanotubes
Abstract
Carbon nanotubes possess various superior properties for use as field emitters, such as sharp tips with a nanometer-scale radius of curvature [1], high mechanical stiffness [2, 3, 4], high chemical stability [5], and unique electrical properties [6, 7]. Due to the unique tip geometry of the carbon nanotubes, their field emission property is one of the most attractive application [8], which has been extensively studied using the classical technique. In this chapter, we introduce a few novel applications of TEM in characterizing the field emission properties of carbon nanotubes, with a focus on the characteristics of individual carbon nanotubes.
Keywords
Carbon Nanotubes Work Function Field Emission Property Electron Holography Individual Carbon NanotubesPreview
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