Augmented Reality for Nano Manipulation

  • Ning XiEmail author
  • Bo Song
  • Ruiguo Yang
  • King Lai


In recent research in nano and micro world, the Atomic Force Microscope (AFM) [1] plays more and more important role because of high resolution image [2] and vacuum free working environment. With the help of AFM, it makes people more convenience to get high quality live cell or fixed cell image [3]. The AFM also has the ability to test and measure the mechanical characteristic of sample such as force curve, Young’s modulus and roughness [3, 4], therefore, some researchers [4–6] focus on the subject of measuring the mechanical property of living cell or using functionalized tip to stimulate the cell by means of electric or chemical solution [7–9]. The vacuum free working environment makes AFM much more flexible in various working conditions both in air and liquid.


Atomic Force Microscope Visual Feedback Atomic Force Microscope Image Augmented Reality HaCaT Cell 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



This research work is partially supported under NSF Grants IIS-0713346 and DMI-0500372; ONR Grants N00014-04-1-0799 and N00014-07-1-0935; NIH Grant: R43 GM084520 (Angelo).

The authors would also like to thank Dr. Chanmin Su of Bruker Nano Surface Instrumentation Group (former Veeco Instrument Inc.) for his technical advice and help during the process of this research.


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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Department of Electrical and Computer EngineeringMichigan State UniversityEast LansingUSA

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