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Computational Schemes for Quantitative X-Ray Analysis: On-Line Analysis with Small Computers

  • H. Yakowitz

Abstract

This chapter will deal primarily with rapid means to perform data reduction for quantitative electron probe microanalysis with the aid of small computational devices (desk calculator to 8K machine). Since the two basic correctional procedures—ZAF and hyperbolic approximation—have already been discussed in Chapter IX, the computational schemes will be emphasized. Included will be a complete discussion of a ZAF program packaged for on-line data reduction and the basis for use of the hyperbolic approximation on-line. For the laboratory that only does occasional quantitative analysis, a brief discussion is given of how to obtain an analysis with a desk calculator in a reasonable time—about 2 hr for a six-component system or 30 min for a binary is needed, starting from scratch.

Keywords

Mass Attenuation Coefficient Fluorescence Correction Desk Calculator Hyperbolic Approximation Frame Program 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    D. R. Reaman and J. A. Isasi, Anal. Chem 42, 1540 (1970).CrossRefGoogle Scholar
  2. 2.
    J. W. Colby, in Advances in X-Ray Analysis (J. B. Newkirk, G. R. Mallett, and H. G. Pfeiffer, eds.), Vol. 11, Plenum Press, New York (1968), p. 287.Google Scholar
  3. 3.
    J. Henoc, K. F. J. Heinrich, and R. L. Myklebust, NBS Technical Note 769 (1973).Google Scholar
  4. 4.
    K. F. J. Heinrich, R. L. Myklebust, H. Yakowitz, and S. D. Rasberry, “A Simple Correction Procedure for Quantitative Electron Probe Microanalysis,” NBS Technical Note 719, U.S. Government Printing Office, Washington, D.C. (1972).Google Scholar
  5. 5.
    A. Ruark and F. E. Brammer, Phys. Rev., 52, 322 (1937).CrossRefGoogle Scholar
  6. 6.
    K. F. J. Heinrich, D. L. Vieth, and H. Yakowitz, in Advances in X-Ray Analysis (G. R. Mallett, M. J. Fay, and W. M. Mueller, eds.), Vol. 9, Plenum Press, New York (1966), p. 208.Google Scholar
  7. 7.
    K.F.J. Heinrich, H. Yakowitz, and D. L. Vieth, in Proceedings of the 7th National Conference on Electron Probe Microanalysis, San Francisco (1972), Paper 3.Google Scholar
  8. 8.
    K. F. J. Heinrich, in The Electron Microprobe (T. D. McKinley, K. F. J. Heinrich, and D. B. Wittry, eds.) Wiley, New York (1966), p. 296.Google Scholar
  9. 9.
    P. Duncumb and S. J. B. Reed, in Quantitative Electron Probe Microanalysis (K. F. J. Heinrich, ed.), NBS Special Publication 298, U.S. Government Printing Office, Washington, D.C. (1968), p. 133.Google Scholar
  10. 10.
    K. F. J. Heinrich, in Present State of the Classical Theory of Quantitative Electron Probe Microanalysis, NBS Technical Note 521, U.S. Government Printing Office, Washington, D.C. (1970), p. 5.Google Scholar
  11. 11.
    K. F. J. Heinrich, Anal. Chem. 44, 350 (1972).CrossRefGoogle Scholar
  12. 12.
    P. M. Thomas, U.K. Atomic Energy Authority, AERE Report 4593, (1964).Google Scholar
  13. 13.
    K. F. J. Heinrich and H. Yakowitz, Mikrochim. Acta, 1970, 123.Google Scholar
  14. 14.
    S. J. B. Reed, Brit. J. Appl. Phys., 16, 913 (1965).CrossRefGoogle Scholar
  15. 15.
    D. M. Poole, in Quantitative Electron Probe Microanalysis (K. F. J. Heinrich, ed.), NBS Special Publication 298, U.S. Government Printing Office, Washington, D.C. (1968), p. 93.Google Scholar
  16. 16.
    K. F. J. Heinrich, R. L. Myklebust, and S. D. Rasberry, Preparation and Evaluation of SRM’s 481 and 482 Gold-Silver and Gold-Copper Alloys for Microanalysis, NBS Special Publication 260–28, U.S. Government Printing Office, Washington, D.C. (1971).Google Scholar
  17. 17.
    H. Yakowitz, C. E. Fiori, and R. E. Michaelis, Homogeneity Characterization of Fe-3 Si Alloy, NBS Special Publication 260–22, U.S. Government Printing Office, Washington, D.C. (1971).Google Scholar
  18. 18.
    A. E. Bence and A. Albee, J. Geol 76, 382 (1968).CrossRefGoogle Scholar
  19. 19.
    H. Yakowitz, R. E. Michaelis, and D. L. Vieth, in Advances in X-Ray Analysis, Vol. 12, Plenum Press, New York (1969), p. 418.Google Scholar
  20. 20.
    M. J. Berger and S. M. Seltzer, National Academy of Science, National Research Council Publication 1133, Washington, D.C. (1964), p. 205.Google Scholar
  21. 21.
    R. W. Fink, R. C. Jopson, H. Mark and C. D. Swift, Rev. Mod. Phys. 38, 513 (1966).CrossRefGoogle Scholar

Copyright information

© Plenum Press, New York 1975

Authors and Affiliations

  • H. Yakowitz
    • 1
  1. 1.Institute for Materials Research, Metallurgy DivisionNational Bureau of StandardsUSA

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