Environmental Pollutants pp 349-363 | Cite as
Surface Chemical Analysis of Particles by Auger Electron Spectroscopy and ESCA
Abstract
The basic phenomena of Auger electron spectroscopy (AES) and ESCA (electron spectroscopy for chemical analysis, also called XPS; X-ray photoelectron spectroscopy) are described. These surface sensitive (a few atomic layers) analytical methods were used to study flyash samples from the inlet and outlet of an electrostatic precipitator. AES results from the inlet particles indicated uniformity and a surface layer (~20Å thick) rich in Na and K. AES results from the outlet sample indicated two types of particles. One was similar to the input particles. A second was rich in Ca and C relative to the other particles. ESCA results from both inlet and outlet samples indicated a surface layer (~10Å thick) rich in Na, K and C.
Keywords
Auger Electron Auger Electron Spectroscopy Auger Spectrum Electrostatic Precipitator Electron Energy LevelPreview
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