New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy
The achievement of nanometer spatial resolution with direct elemental selectivity would have a tremendous impact on our ability to probe and understand complex phenomena occurring at the nanoscale. The combination of synchrotron-based X-ray spectroscopy with the high spatial resolution of scanning tunneling microscopy (STM) has the potential to help attain this goal. In this chapter we show how synchrotron X-ray-enhanced scanning tunneling microscopy (SXSTM) has evolved from the very early days of photo-assisted STM to become a promising spectroscopy and imaging technique in nanoscience and nanotechnology. The basic principles of SXSTM are discussed accompanied by a presentation of recent experiments.
KeywordsScanning Tunneling Microscopy Total Electron Yield Tunneling Regime Scanning Tunneling Microscopy Measurement NiFe Film
The authors would like to express their gratitude to several people who contributed to this project. Special thanks go to Kenneth Gray for the generous allocation of experimental equipment, which made this work possible in the first place. We thank Vitali Metlushko for the growth and patterning of the studied samples. Curt Preissner is acknowledged for his engineering support and Matthias Bode for several fruitful discussions. This work has been supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
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