DFT and BIST Techniques for Embedded Analog Integrated Filters

K. Lofstrom, “A demonstration IC for the P1149.4 mixed-signal Test Standard”, Proc. of the International Test Conference, pp. 92–98, 1996.Google Scholar

M. Ismail and T. Fiez, “Analog VLSI: Signal and Information Processing”, McGraw Hill, 1994.Google Scholar

R. Gregorian and G. Ternes, “Analog MOS Integrated Circuits for Signal Processing”, Wiley Interscience, 1986.Google Scholar

T. M. Souders and G. N. Stenbakken, “Cutting the high cost of testing”. IEEE Spectrum, pp. 48–51, March 1991.Google Scholar

R. Kapur, R. Chandramouli and T.W. Williams, “Strategies for Low-Cost Test”, IEEE Design & Test of Computers, pp. 47–54, Nov-Dec 2001.Google Scholar

M. Sachdev: “Defect Oriented Testing for CMOS Analog and Digital Circuits”, Kluwer Academic Publishers, 1998Google Scholar

J. Pineda de Gyvez and D.K. Pradhan: “Integrated Circuit Manufacturability: The Art of Process and Design Integration”, IEEE Press, 1999.Google Scholar

B. Vinnakota: “Analog and Mixed-Signal Test”. Prentice Hall, 1998.Google Scholar

M. Abramovici, M. A. Breuer and A. D. Friedman, “Digital System Testing and Testable Design”. New York, Computer Science Press, 1990.Google Scholar

P. P. Fasang, D. Mullins and T. Wong: “Design for Testability for Mixed Analog/Digital ASICs”, Proc. IEEE 1988 Custom Integr. Circ. Conf, pp. 16.5.1–16.5.4, 1988.Google Scholar

K. D . Wagner, T. W. Williams: “Design for Testability of Mixed-Signal Integrated Circuits”. Proc. IEEE 1988 Int. Test Conf., pp 823–828, 1988.Google Scholar

J. L. Huertas, “Test and Design for Testability of Analog and Mixed-signal Integrated Circuits: Theoretical Basis and Pragmatical Approaches”. Selected Topics in Circuits and Systems, H. Dedieu Editor. Elsevier 1993.Google Scholar

C.L. Wey, “Built-in Self-test (BIST) Structure For Analog Circuit Fault Diagnosis” IEEE Trans. on Instr. & Measur., Vol.39, 1990.Google Scholar

M. Soma, “A Design-For-Test Methodology for Active Analog Filters”, Proc. IEEE Int. Test Conf., pp 183–192, 1990.Google Scholar

G. Schafer, H. Sapotta and W. Denner: “Block-oriented Test Strategy For Analog Circuits” Proc. of European Solid-State Circuits Conference, pp.217220, 1991.Google Scholar

J.L. Huertas, A. Rueda and D. Vázquez: “Improving the Testability of Switched-Capacitor Filters”, Int. Journal of Electronic Testing, Vol. 4, No. 4, pp. 299–313, November 1993.CrossRefGoogle Scholar

M. Ohletz, “Hybrid Built-in Self-test (HBIST) For Mixed Analogue/Digital Integrated Circuits”, Proc. European Test Conerence, pp.307–316, 1991.Google Scholar

M. Soma and V. Kolarik, “A Design-For-Test Technique for Switched-Capacitor Filters”, Proc. IEEE Int. Test Conerence., pp 42–47, 1994.Google Scholar

D. Vázquez, A. Rueda, J.L. Huertas and A.M.D. Richardson, “Practical DfT Strategy for Fault Diagnosis in Active Analogue Filters ”. IEE Elec. Letters, Vol. 31, N. 15, pp. 1221–1222, July 1995.CrossRefGoogle Scholar

D. Vazquez, A. Rueda, J. L. Huertas, “A DFT Methodology for Fault Diagnosis in Active Analog Filters”. Proc. Int. Mixed Signal Testing Workshop ’95, Grenoble (France), pp. 124–129, June 1995.Google Scholar

M Renovell, F. Azais and Y. Bertrand, “A DFT Technique to Fully Access Embedded Modules in Analog Circuits Under Test”. Proc. Int. Mixed Signal Testing Workshop ’95, Grenoble (France), pp. 172–177, June 1995.Google Scholar

A.H. Bratt, R.J. Harvey, A.P. Dorey and A.M.D. Richardson, “Design-For-Test Structure to Facilitate Test Vector Application with Low Performance Loss in Non-Test Mode”. IEE Elec. Letters, Vol. 29, No. 16, pp. 1438–1440, Aug. 1993.CrossRefGoogle Scholar

C.L. Wey and S. Krishnan, “Built-In-Self-Test (BIST) Structures for Analog Circuit Fault Diagnosis with Current test Data”, IEEE Trans. on Instrumentation and Measurement, Vol 41, NO, 4, August 1992.Google Scholar

Yunsheng Lu, et al, “ Structure and Metrology for a Single-Wire Analog Testability Bus”, Proc. of IEEE International Test Conference, pp. 919–928, 1994Google Scholar

K. Parker, J.E. McDermid and S. Oresjo, “Structure and metrology for an Analog testability Bus”; Proc. of IEEE International Test Conference, pp. 309320, 1993.Google Scholar

P.M. Van PeteGhem and J.F. Duque, “Compact High-Frequency Output Buffer for Testing of Analog CMOS VLSI circuits”, IEEE Journal of Solid-State Circuits, Vol. 24, pp. 540–542, 1989.CrossRefGoogle Scholar

S. Sunter, “A Low Cost 100MHz Analog test Bus”, Proc. of VLSI Test Symposium, pp. 60–65, 1995.Google Scholar

D. Vázquez, J.L. Huertas and A. Rueda, “ A New Strategy for Testing Analog Filters”, Proc. IEEE VLSI Test Symposium, pp. 36–41, April, 1994.Google Scholar

D. Vázquez, A. Rueda and J. L. Huertas, “On-Line Error Detection for Continuous-Time MOSFET-C Filters”. Proc. of European Solid-State Circuits, pp. 206–209, Sevilla, September 1993.Google Scholar

D. Vázquez, J.L. Huertas and A. Rueda, “Reducing the impact of DfT on the Performance of Analog Integrated Circuits: Improved Sw-Opamp Design”. Proc. VLSI Test Syposium, pp. 42–47, 1996.Google Scholar

D. Vazquez, A. Rueda and J. L. Huertas, “Fully-Differential SW-Opamp for Testing Analog Embeded Modules”. Proc. of Int. Mixed Signal Testing Workshop, Quebec, 1996.Google Scholar

B.W. Johnson, “Design and Analysis of Fault Tolerant Digital Systems”, Addison Wesley, 1989.Google Scholar

P. K. Lala: “Fault tolerant & fault testable hardware design”. Prentice Hall, 1986.Google Scholar

D. Vazquez, A. Rueda, J. L. Huertas, “A Practical Implementation of Fault-Tolerant Switched Capacitor Circuits”, Proc. of Int. Symposium on Circuits and Systems (ISCAS), pp. 1565–1568, Singapore, June 1991Google Scholar

J. L. Huertas, A. Rueda, and D. Vazquez, “Testable switched-capacitor filters”. IEEE Jour. of Solid-State Circuits, V. 28, n. 7, pp. 719–724. July 1993.CrossRefGoogle Scholar

Chatterjee, “Concurrent Error Detection and Fault-tolerance in Linear Analog Circuits Using Continuous Checksums”, IEEE Trans. on VLSI Systems, Vol. 1, No 2, pp. 138–150, June 1993.CrossRefGoogle Scholar

N.J. Stessman, B. Vinakkota and R. Harjani, “System-Level Design-for-Test in Analog Circuits”, IEEE Journal of Solid-State-Circuits, pp. 1320–1326, October 1996.Google Scholar

S. Mir, V. Kolarik, M. Lubaszewsky, and B. Curtois, “Built-In-Self-Test and fault diagnosis in Fully Differential Circuits”, Proc. of Int. Conf. on Computer-Aided Design, 1994.Google Scholar

E. Peralias, A. Rueda and J. L. Huertas, “An On-line testing approach for Pipelined A/D Converters”. Proc. of Int. Mixed-signal Test Workshop, pp. 44–49, 1995.Google Scholar

D. Vázquez, A. Rueda and J. L. Huertas, “A solution for the on-line test of analog ladder filters”. Proc. VLSI Test Symposium, pp. 48–53, 1995Google Scholar

V. Kolarik, M. Lubaszewsky, and B. Curtois, “Towards Self-Checking Mixed-Signal Integrated Circuits”, Proc. of European Solid-State Circuits Conference, pp. 202–205, 1993.Google Scholar

V. Kolarik, M. Lubaszewsky, and B. Curtois, “Designing Self-Exercising Analogue Checkers”, Proc. of VLSI Test Symposium, pp. 252–257, 1994.Google Scholar

M. Lubaszewsky, S. Mir and L. Pulz, “A Multifunctional Test Structure for Analog BIST”, Proc. of International Mixed-Signal test Workshop, 1995.Google Scholar

B. Dufort and G.W. Roberts, “On-Chip Analog Signal Generation for Mixed-Signal Built-In-Self-Test”, IEEE Journal of Solid-State Circuits, Vol. 33, No. 3, pp. 318–330, March 1990.Google Scholar

N. Nagi, A. Chatterjee and J.A. Abraham, “A Signature Analyzer for Analog and Mixed-Signal Circuits”, Proc. of Int. Conf on Computer-Aided Design, pp. 284–287, 1994.Google Scholar

M. Renovell, F. Azais and Y. Bertrand, “On-Chip ANalog Output Response Compaction”, Proc. of the European Design & Test Conference, pp. 568–572, 1997.Google Scholar

K. Arabi, B. Kaminska.“Oscillation- Test Methodology for Low-Cost Testing of Active Analog Filters” Trans. on Instrumentation and Measurement, vol. 48, no. 4, pp. 798–806, Aug. 1999.CrossRefGoogle Scholar

K. Arabi and B. Kaminska.“Oscillation-Test Strategy for Analog and Mixed-Signal Integrated Circuits” 14h VLSI Test Symposium, 1996, pp. 476–482.Google Scholar

G. Huertas, D. Vázquez, E. J. Peralías, A. Rueda and J. L. Huertas , “Testing Mixed-Signal Cores: A Practical Oscillation-Based Test in an Analog Macrocell”, IEEE Design & Test of Computers, pp. 73–82, Vol 19, No 6, pp. 64–72, 2002.CrossRefGoogle Scholar

D. Vázquez, G. Huertas, G. Leger, A. Rueda and J.L. Huertas, “On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched-Capacitor Circuits”, Analog Integrated Circuits and Signal Processing, Kluwer Academic Publishers, Vol 33, 2002.Google Scholar

M.V. Mahoney, “DSP-Based Testing of Analog and Mixed-Signal Circuits”, IEEE Computer Society Press, 1987.Google Scholar

G. Huertas, D. Vázquez, E. J. Peralías, A. Rueda and J. L. Huertas , “Practical Oscillation-Based Test of Integrated Filters”, IEEE Design & Test of Computers, Vol 19, No 6, pp. 64–72, 2002.CrossRefGoogle Scholar

A.K. Lu, G.W. Roberts, and D. Johns, “ A high quality analog oscillator using oversampling D/A conversion techniques”, IEEE Trans. on Circuits and Systems II: Analog and Digital Processing, pp. 437–444, 1994.Google Scholar

X. Haurie and G.W. Roberts, “Arbitrary-precision signal generation for bandlimited mixed-signal testing”, Proc. of the IEEE International Test Conference, pp. 78–86, 1995.Google Scholar

M.F. Toner and A.W. Roberts, “A BIST scheme for an SNR, gain tracking and frequency response test of a sigma-delta ADC”, Proc. of the VLSI Test Symposium, pp. 60–65, 1994.Google Scholar

G. Huertas, D. Vazquez, A. Rueda and J.L. Huertas. “Effective Oscillation-Based Test for application to a DTMF Filter Bank”. Proc. IEEE International Test Conference, September 1999, pp. 549–555.Google Scholar

Hassan IHS, K. Arabi, B. Kaminska. “Testing Digital to Analog Converters Based on Oscillation-Test Strategy Using Sigma-delta Modulation”. Int. Conference on Computer Design (ICCD 98), Oct. 1998.Google Scholar

M. Vidyasagar, “Nonlinear Systems Analysis”, Prentice-Hall, New Jersey 1978.Google Scholar

K. Arabi and B. Kaminska, “Testing Analog and Mixed-Signal Integrated Circuits Using Oscillation-Test Method”. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.16, no. 7, July 1997.Google Scholar

M. Santo-Zarnik, F. Novak, S. Macek, “Design of Oscillation-based Test Structures for Active RC Filters”. European Design & Test Conference, pp 618, 1997.Google Scholar

G. Huertas, D. Vazquez, A. Rueda and J.L. Huertas, “Oscillation-based Test Experiments in Filters: A DTMF Example”, Proc. International Mixed-signal Test Workshop, pp.249–253, Whistler, June 1999.Google Scholar

S. Norsworthy, R. Schreier, G. Temes: “Delta-sigma data converters”, IEEE Press, 1997.Google Scholar

D. Vázquez, G. Huertas, A. Rueda and J.L. Huertas: “DTMF Silicon Demonstrator Report ”, Internal Report of the European Sprit Project ASTERIS.Google Scholar

D. Vázquez, G. Huertas, A. Rueda and J.L. Huertas: “A Simple and Secure Start-Up Circuitry for Oscillation-Based-T Application”, Analog Integrated Circuits and Signal Processing, Kluwer Academic Publishers, Vol 32, pp. 187190, 2002.Google Scholar

J. Roh and J. Abraham. “A Comprehensive TDM Comparator Scheme for Effective Analysis of Oscillation-based Test”. Proc. IEEE VLSI Test Symposium, April 2000, pp143–148.Google Scholar

G. Huertas, D. Vazquez, A. Rueda and J.L. Huertas. “Practical Methods for Reading Test Outcomes in Oscillation-Based Test”. Int. Mixed-signal Test Workshop, June 2000.Google Scholar

D. Vázquez, G. Huertas, G. Leger, A. Rueda and J.L. Huertas, “Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and Onchip Evaluation”, Proc. of VLSI Test Symposium, 2002.Google Scholar

D. Vázquez, A. Rueda, J. L. Huertas and E. Peralías: “A High-Q Bandpass Fully Differential SC Filter with Enhanced Testability”, IEEE Int. Journal of Solid-State Circuits, 1998.Google Scholar

F. Alberti et al.: “3V Bicmos Analog Front-End for RDS Demodulation System”. Proc. of European Solid-State Circuits Conference, pp. 112–115, 1994.Google Scholar