A new algorithm for 3D profilometry based on phase measurement

  • Luigi Di Stefano
  • Frank Boland
Session 5: Shapes & Surfaces
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1310)

Abstract

This paper describes a new phase extraction algorithm for phase profilometry. The algorithm uses a square wave to demodulate phase and moving averages and comb-shaped filters to extract the phase information from low-frequency. The proposed algorithm is compared with the two major profilometry techniques, namely Fourier domain profilometry and signal domain profilometry based on FIR low-pass filtering.

Keywords

Fringe Pattern Fine Pattern Comb Filter Phase Profile Dublin Trinity College 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

  1. 1.
    D. Poussart and D. Laurendau. 3-D sensing for industrial computer vision. in J. Sanz, editor, Advances in Machine Vision, Springer-Verlag, 1989.Google Scholar
  2. 2.
    P. Besl. Active, optical range imaging sensors. Machine Vision and Applications, Vol. 1, 1988.Google Scholar
  3. 3.
    M. Takeda, H. Ina and S. Kobayashi. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry. Journal of the Optical Society of America, Vol. 72, No. 1, 1982.Google Scholar
  4. 4.
    M. Takeda and K. Mutoh. Fourier transform profilometry for the automatic measurement of 3-D object shapes. Applied Optics, Vol. 22, No. 24, 1983.Google Scholar
  5. 5.
    S. Tang and Y. Hung. Fast profilometer for the automatic measurement of 3-D object shapes. Applied Optics, Vol. 29, No. 20, 1990.Google Scholar
  6. 6.
    E. Cunningham. Digital Filtering: an introduction. Houghton Mifflin, 1992.Google Scholar
  7. 7.
    G. Sansoni, L. Biancardi, U. Minoni and F. Docchio. A Novel Adaptive System for 3-D Optical Profilometry Using a Liquid Crystal Light Projector. IEEE Transactions on Instrumentation and Measurement, Vol. 43, No. 4, 1994.Google Scholar
  8. 8.
    L. Di Stefano and F. Boland. Three-Dimensional Inspection of Printed Circuit Boards Using Phase Profilometry. In Proceedings of EUSIPCO-96, Trieste, 10–13 September, 1996.Google Scholar
  9. 9.
    L. Di Stefano and F. Boland. Solder paste inspection by structured light methods based on phase measurement. In SPIE Proceedings, Vol. 2899, 1996.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1997

Authors and Affiliations

  • Luigi Di Stefano
    • 1
  • Frank Boland
    • 2
  1. 1.DEISUniversity of BolognaBolognaItaly
  2. 2.EEEUniversity of DublinDublinIreland

Personalised recommendations