Ring-banyan network: A fault tolerant multistage interconnection network and its fault diagnosis

  • Jae-Hyun Park
  • Heung-Kyu Lee
  • Ju-Hyun Cho
Session 12: Switching networks and hypercubes
Part of the Lecture Notes in Computer Science book series (LNCS, volume 852)

Abstract

In this paper. we describe the fault tolerant schemes for the multistage interconnection network (MIN) and its fault diagnosis. Firstly, we present a fault tolerant MIN and a adaptive self-routing scheme for the network. It can provide more multiple paths than the previous networks between an input/output pair of a network by adding extra links between switching elements in the same stage and modifying the self-routing scheme of the regular MIN. The presented routing scheme is as simple as that of the regular MIN, which is based on the topological relationships among the switching elements (SE's) that render a packet to the same destination with the regular self-routing. We present an algebraic proof to show the correctness of the scheme, and an analytic reliability analysis to provide quantitative comparisons with other some networks. Of the special notes is the finding that the network is more cost effective than the regular MIN and other augmented MIN's in terms of the reliability. Secondary. we consider the fault models in the fault detection and the location schemes. We present a new fault diagnosis scheme for the network.

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References

  1. 1.
    Adams III, G., Agrawal, D., Siegel, H. J.: A Survey and Comparison of Fault-Tolerant Multistage InterconnectionNetworks. IEEE Computer. 20 (June 1987) 14–27Google Scholar
  2. 2.
    Agrawal, D. P.: Testing and Fault Tolerance of Multistage Interconnection Networks. IEEE Computer. 15 (Apr 1982) 41–53Google Scholar
  3. 3.
    Feng, T. Y.: A Survey of Interconnection Networks. IEEE Computer. (Dec. 1981) 12–27Google Scholar
  4. 4.
    Wu, C., Feng, T.: On a Class of Multistage Interconnections Networks. IEEE Trans. on Comp. C-29 (Aug. 1980) 694–702Google Scholar
  5. 5.
    Park, J., Yoon, H., Lee, H., Eun, S.: The Ring-Banyan Network: A Fault-Tolerant Multistage Interconnection Network with an Adaptive Self-routing. Proc. 1992 Int'l Conf. on Parallel and Distributed Systems. (Hsinshu, Taiwan, R.O.C.) (Dec. 1992) 196–203Google Scholar
  6. 6.
    Kumer, V. P., Reddy, S. M.: Augmented Shuffle-Exchange Multistage Interconnection networks. IEEE Computer. 20 (June 1987) 30–40Google Scholar
  7. 7.
    Feng, T. Y., Wu. C. L.: Fault-Diagnosis for a Class of Multistage Interconnection Networks. IEEE Trans. on Comp. C-30 (Oct. 1981) 743–758Google Scholar
  8. 8.
    Lea, C.-T. A.: Load-Sharing Banyan Network. IEEE Trans. on Comp. C-35 (Dec. 1986) 1025–1034Google Scholar
  9. 9.
    Lee, K. Y., Yoon, H.: The B-Network: A Multistage Interconnection Network with Backward Links. IEEE Trans. on Comp. 39 (April 1990) 966–969CrossRefGoogle Scholar
  10. 10.
    Tzeng, N., Yew, P., Zhu, C.: A Fault-Tolerant Scheme for Multistage Interconnection Networks. Proc. 12th Int'l Symp. Computer Architecture. (June 1985) 368–375Google Scholar
  11. 11.
    Urushidani, S.: Rerouting Network: A High-Performance Self-Routing Switch for B-ISDN. IEEE Trans. on Selected Areas in Comm. 9 (Oct. 1991) 1194–1204CrossRefGoogle Scholar
  12. 12.
    Adams III, G. B. A., Siegal, H. J.: The Extra Stage Cube: A Fault-Tolerance Interconnection Network for Supersystems. IEEE Trans. on Comp. C-31 (May 1982) 443–453Google Scholar
  13. 13.
    Adams III, G. B. A., Siegal, H. J.: Modifications to improve the fault tolerance of the extra stage cube interconnection network. Proc. 1984 Int'l Conf. Parallel Processing. (Aug. 1984) 169–173Google Scholar
  14. 14.
    Padmanabhan, K.: A Class of Redundant Path Multistage Interconnection networks. IEEE Trans. on Comp. C-32 (Dec 1983) 1099–1108Google Scholar
  15. 15.
    Reddy, S. M., Kumer, V. P.: On fault-tolerant multistage interconnection networks. Proc. 1984 Int'l Conf. Parallel Processing. (Aug. 1984) 155–164Google Scholar
  16. 16.
    McMillen, R. J., Siegel, H. J.: Performance and fault tolerance improvements in the inverse augmented data manipulator network. Proc. 9th Annu. Symp. Computer Architecture. (1982) 63–72Google Scholar
  17. 17.
    Goke, G. R., Lipovski, G. J.: Banyan networks for partitioning multiprocessor systems. Proc. 1st Annu. Symp. Computer Architecture. (1973) 21–28Google Scholar
  18. 18.
    Davis IV, N. J. D., Hsu, W. T.-Y.: Fault Location Techniques for Distributed Control Interconnection Networks. IEEE Trans. on Comp. C-34 (Oct. 1985) 902–910Google Scholar
  19. 19.
    Fuchs, W. K., Abraham, J. A., Hwang, K. H.: Concurrent Error Detection in VLSI Interconnection Networks. Proc. 10th Annu. Symp. Computer Architecture. (1983) 309–315Google Scholar
  20. 20.
    Breuer, M. A., Friedman, A. D.: Diagnosis and Reliable Design of Digital Systems. Rockvill, Md. Computer Science Press. (1976)Google Scholar
  21. 21.
    Weiss, C. W., Friedman, A. D.: Bounds on the Length of Terminal Stuck-fault Tests. IEEE Trans. on Comp. C-21 (Mar. 1972) 305–309Google Scholar
  22. 22.
    Agrawal, D. P.: Automated testing of computer networks. Proc. 1980 Int'l Conf. Circuits and Computers. (Oct. 1980) 717–720Google Scholar
  23. 23.
    McConnel, S. R., Siewiorek, D. P., Tsao, M. M.: The measurement and analysis of transient errors in digital computer systems. Proc. 1979 Int'l Symposium on Fault-Tolerant Computing. (June 1979) 67–70Google Scholar

Copyright information

© Springer-Verlag 1994

Authors and Affiliations

  • Jae-Hyun Park
    • 1
  • Heung-Kyu Lee
    • 1
  • Ju-Hyun Cho
    • 2
  1. 1.Dept. of Computer ScienceKorea Advanced Institute of Science and TechnologyTaejonKorea
  2. 2.Control System SectionElectronics and Telecommunications Research InstituteTaejonKorea

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