Some Problems in Trying to Implement Uncertainty Techniques in Automated Inspection

  • Duncan Wilson
  • Alistair Greig
  • John Gilby
  • Robert Smith
Chapter
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1455)

Abstract

This paper discusses the difficulties in applying uncertainty management techniques to real world problems. Automated Inspection is a process where the data used to model the environment is uncertain. There is an existing body of knowledge within the research community which enables such uncertain information to be expressed. Although there have been successful applications in fields such as medical diagnosis, there are also problems in industry which currently cannot be solved. The process of industrial inspection is an environment where the method for applying uncertainty management techniques is not intuitive. The nature of the uncertainty and the difficulty in applying the theoretical techniques to real world problems shall be the focus of the following discussion.

Keywords

Defect Type Inspection System Orange Peel Uncertain Information Machine Vision System 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Bayro-Corrachano E, Review of Automated Visual Inspection 1983–1993, Part II: Approaches to Intelligent Systems, SPIE, Vol. 2055, 1993, 159–172CrossRefGoogle Scholar
  2. 2.
    Bonissone P, Reasoning Plausible, in ‘Encyclopedia of Artificial Intelligence’, S Shapiro, 1992Google Scholar
  3. 3.
    Chou PB, RA Rao, MC Sturzenbecker, VH Brecker, Automatic defect classification for integrated circuits, SPIE Vol. 1907 Machine Vision applications in industrial inspection, pp 95–103, 1993Google Scholar
  4. 4.
    D’Haeyer J, Reliable Flaw classifiers for machine vision based quality control, SPIE Vol. 2597, pp 119–130, 1995CrossRefGoogle Scholar
  5. 5.
    Gel Count Forum-Raw Data, Image Automation Ltd., Texas, USA, June 1993Google Scholar
  6. 6.
    Holmes J, Technical Note-Setting up the L30, Image Automation Ltd., Sept. 1994Google Scholar
  7. 7.
    Krause P and Clark D, Representing Uncertain Knowledge an Artificial Intelligence Approach, Intellect Books, 1993Google Scholar
  8. 8.
    Lu N, Tredgold A and Fielding E, The use of machine vision and fuzzy sets to classify soft fruit, SPIE Vol. 2620, pp 663–669, 1995.CrossRefGoogle Scholar
  9. 9.
    Luria M, Moran M, Yaffe D and Kawski J, Automatic defect classification using Fuzzy Logic, IEEE / SEMI Advanced Semiconductor Manufacturing Conference, p191–193, 1993Google Scholar
  10. 10.
    Perner P, A knowledge based image inspection system for automatic defect recognition, classification and process diagnosis, Machine Vision and Applications, 7:pp 135–147 1994CrossRefGoogle Scholar
  11. 11.
    Petrou M, Automated intelligent inspection for quality control, Invited presentation, Sira Technology Centre Intelligent Imaging Programme, General Meeting, 7 June 1995.Google Scholar
  12. 12.
    Raafat H and Taboun S, An integrated robotic and machine vision system for surface flaw detection and classification, Computers Industrial Engineering, Vol.30, No.1 pp27–40.Google Scholar
  13. 13.
    Rao R and Jain R, A classification scheme for visual defects arising in semiconductor wafer inspection, Journal of Crystal Growth, 103 pp398–406, 1990.CrossRefGoogle Scholar
  14. 14.
    Resin Grading and Gel Counting Technical User Forum, Image Automation Ltd., Texas, USA, June 1993Google Scholar
  15. 15.
    Saffiotti A, Issues of knowledge representation in Dempster-Shafer Theory, in Advances in the Dempster-Shafer Theory of Evidence, Ed. Yager RR, Kacprzyk J, Fedrizzi M, John Wiley, 1994.Google Scholar
  16. 16.
    Shafer G, A Mathematical Theory of Evidence, Princeton University Press, 1976Google Scholar
  17. 17.
    Sherman R, Tirosh E and Smilansky Z, An automatic defect classification system for semiconductor wafers, SPIE Vol. 1907 Machine Vision applications in industrial inspection, pp72–79, 1993CrossRefGoogle Scholar
  18. 18.
    Shortliffe, E.H., Rule Based Expert Systems, the MYCIN Experiments of the Stanford Heuristics Programming Project, Addison Wesley 1985Google Scholar
  19. 19.
    Zadeh L, Knowledge Representation in Fuzzy Logic, pp 1–26, in An introduction to Fuzzy Logic applications in intelligent systems, ed R Yager, Kluwer 1992Google Scholar
  20. 20.
    Zimmerman HJ, Fuzzy Set Theory and its applications, Kluwer Academic Publishers, USA, 1991Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1998

Authors and Affiliations

  • Duncan Wilson
    • 1
    • 2
  • Alistair Greig
    • 1
  • John Gilby
    • 2
  • Robert Smith
    • 2
  1. 1.Department of Mechanical EngineeringUniversity College LondonLondonUK
  2. 2.Sira Technology CentreSira Ltd.Chislehurst, KentUK

Personalised recommendations