Parallel Implementation in a Industrial Framework of Statistical Tolerancing Analysis in Microelectronics
The aim of this work is to report on a parallel implementation of methods for tolerance analysis in the framework of a micro-electronics design center. The methods were designed to run parallelly on different platforms which could have different computational performances. In order to distribute the computations over a network of work-stations, the algorithm was designed not by using a parallel compiler, but by using a RPC multi-server network. We have used essentially two methods. The first is the Monte Carlo approach, the second is based on an approximation by numerical integration or quadrature technique [1, 2, 3, 4], which requires far less function evaluations than the Monte Carlo method. These two approaches have been implemented in a parallel algorithm to be used on a cluster of multivendor workstations.
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