PARA 2002: Applied Parallel Computing pp 507-514 | Cite as
Reliability Bounds for Large Multistage Interconnection Networks
Abstract
To derive the exact reliability expressions for large Multistage Interconnection Networks (MINs) can become rather complex. As network size increases, the reliability bounds could be used to estimate the reliability of the networks. In this paper, terminal, broadcast, lower and upper bounds network reliability will be determined. Lower bound reliability is the minimum probability that the system will be operational for a specified time. Upper bound reliability presents an optimistic view of probability that the system will work at some specified time, which is not the center of attention in terms of reliability point of view. If the lower bound reliability provides sufficient assurance that the system will be operational at some specified time, then no further effort for obtaining the exact reliability expression is necessary. As examples, the derivation of terminal, broadcast, lower and upper bounds network reliability expressions of the extra-stage cube network will be demonstrated.
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References
- 1.Adams III, G. B. and Siegel, H. J. “The Extra Stage Cube: A Fault Tolerant Interconnection Network for Supersystems”. IEEE Transactions on Computer. 1982. pp. 443–454.Google Scholar
- 2.Booting, C., Rai, S., and Agrawal, D. P. “Reliability Computation of Multistage Interconnection Networks”. IEEE Transactions on Reliability. Vol. 38, No. 1. 1994. pp. 138–145.CrossRefGoogle Scholar
- 3.Fard, N. and Gunawan, I. “Performance Improvement in Communication Network Systems”. Proceedings of IV SIMPOI/POMS 2001. August 11–14, 2001. Guaruja/SP. 2001.Google Scholar
- 4.Ni, L. M. “Issues in Designing Truly Scalable Interconnection Networks”. Proceedings of the 1996 ICPP Workshop on Challenges for Parallel Processing. 1996. pp. 74–83.Google Scholar
- 5.Thurber, K. J. “Parallel Processor Architectures—Part 1: General Purpose Systems“. Computer Design. Vol. 18 (1979). pp. 89–97.Google Scholar