Real-space imaging and motion analysis in sheared colloidal crystals
Microscopic imaging of single particles is a powerful tool to investigate the local structure of colloidal suspensions. For single-particle identification with high-resolution microscopy the resolution power is limited by refraction to roughly the wavelength of light. In this case the depth of sharpness is on a scale of less than this limit. For this reason the simultaneous observation of particles in two or more layers of a colloidal crystal seems to be impossible. We report a method with which we can image more than one particle layer in dilute colloidal suspensions with preserved resolution. The analysis of the images obtained, in particular for the investigation of crystal layer motion in sheared colloidal crystals, is discussed.
Key wordsColloidal suspensions Particle identification Microscopy Depth of sharpness Shear mechanism
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