Near-Field Microscope Probes Utilizing Surface Plasmon Polaritons

  • Satoshi Kawata
Chapter
Part of the Topics in Applied Physics book series (TAP, volume 81)

Abstract

The near-field microscope is characterized by its super-resolution capability. It exceeds the classical limit of spatial resolution of the light microscope due to the wave nature of photons or the diffraction of light. In this chapter, a general review of the methods for super-resolution in imaging optics is given, and how nearfield optics enables the super-resolution is explained using the Ewald sphere. The common and distinctive mechanisms and functions of different near-field probes are compared using eight configurations including the probes associated with surface plasmon polaritons.

The imaging mechanism of the near-field optical micrscope is different from the classical light microscope; the light intensity is detected as a result of strong electromagnetic interaction between the probe and the sample structure in the near-field via evanescent photons, so that the system is not a linear passive one but a more complex one. Since this microscope uses photons to see the structure, the energy or wavelength range in the optical spectrum is an important issue to be discussed. This chapter describes these topics as an introduction to the following chapters.

Keywords

Surface Plasmon Polariton Evanescent Wave Dispersion Relationship Scan Optical Microscope Subwavelength Structure 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    S. Nakamura, Jpn. J. Appl. Phys. 31, 8 (1993)CrossRefGoogle Scholar
  2. 2.
    J. M. Guerra, Photon tunneling microscopy, Appl. Opt. 29, 3741–3752 (1990)ADSCrossRefGoogle Scholar
  3. 3.
    T. Nakano, S. Kawata, Evanescent-field scanning microscope with fourier-transform infrared spectrometer, Scanning 16, 368–371 (1994)Google Scholar
  4. 4.
    W. Lukosz, M. Marchand, Foundations for Microwave Engineering (McGraw Hill, London 1963)Google Scholar
  5. 5.
    R. E. Collin, Opt. Acta. 10, 241 (1963)Google Scholar
  6. 6.
    K. Aratani, A. Fukumot, Ohta, M. Kaneko, K. Watanabe, SPIE 1449, 209–215 (1991)CrossRefGoogle Scholar
  7. 7.
    T. Tsujioka, M. Kume, Y. Horikawa, A. Ishikawa, M. Irie, Super-Resolution Disk with a Photochromic Mask Layer, Jpn. J. Appl. Phys. 36, 526–529 (1997)CrossRefADSGoogle Scholar
  8. 8.
    H. Raether, Sufrace Plasmons on Smooth and Rough Surfaces and on Gratings (Springer, Berlin, Heidelberg 1988)Google Scholar
  9. 9.
    K. Matsubara, S. Kawata, S. Minami, Optical chemical sensor based on surface plasmon measurement, Appl. Opt. 27, 1160–1163 (1988)ADSCrossRefGoogle Scholar
  10. 10.
    N. Hayazawa, Y. Inouye, S. Kawata, Evanescent field excitation and measurement of dye fluorescence in metallic probe near-field scanning optical microscope, J. Microsc. 194, 472–476 (1999)CrossRefGoogle Scholar
  11. 11.
    J. H. McLeod, J. Opt. Soc. Am. 44, 592–597 (1954)ADSCrossRefGoogle Scholar
  12. 12.
    R. Arimoto, C. Saloma, T. Tanaka, S. Kawata, Imaging Properties of Axicon in a Scanning Optical System, Appl. Opt. 31, 6653–6657 (1992)ADSCrossRefGoogle Scholar
  13. 13.
    S. Kawata, Grating for superresolution, O. plus E. 154, 173–180 (1992)Google Scholar
  14. 14.
    F. Zenhausern, M. P. O’Boyle, H. K. Wickramasinghe, Apertureless near-field optical microscope, Appl. Phys. Lett. 65, 1623–1625 (1994)CrossRefADSGoogle Scholar
  15. 15.
    S. Kawata, Y. Inouye, T. Sugiura, T. Near-field Scanning Optical Microscope with a Laser Trapped Probe, Jpn. J. Appl. Phys. 33, L1725–L1727 (1994)CrossRefADSGoogle Scholar
  16. 16.
    T. Sugiura, T. Okada, Y. Inouye, O. Nakamura, S. Kawata, Gold-bead scanning near-field optical microscope with laser-force position control, Opt. Lett. 22, 1663–1665 (1997)ADSCrossRefGoogle Scholar
  17. 17.
    Y. Inouye, S. Kawata, Near-field Scanning Optical Microscope using a Metallic Probe Tip, Opt. Lett. 19, 159–161 (1994)ADSCrossRefGoogle Scholar
  18. 18.
    E. H. Synge, A Suggested method for extending microscopic resolution into the ultra-microscopic region, Philos. Mag. 6, 356 (1928)Google Scholar
  19. 19.
    J. A. O’keffe, J. Opt. Soc. Am. 46, 359 (1956)CrossRefGoogle Scholar
  20. 20.
    E. A. Ash, G. Nicholls, Super-resolution Aperture Scanning Microscope, Nature 237, 510 (1972)CrossRefADSGoogle Scholar
  21. 21.
    D. W. Pohl, W. Denk, M. Lanz, Appl. Phys. Lett. 44, 651–653 (1984)CrossRefADSGoogle Scholar
  22. 22.
    A. Lewis, M. Isaacson, A. Harootunian, A. Muray, Ultramicrosc. 13, 227–232 (1984)CrossRefGoogle Scholar
  23. 23.
    A. Lahrech, P. Bachelot, P. Gleyzes, A. C. Boccara, Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600, Opt. Lett. 21, 1315–1317 (1996)ADSCrossRefGoogle Scholar
  24. 24.
    F. Zenhausern, Y. Martin, H. K. Wickramasinghe, Scanning interferometric apertureless microscopy: optical imaging at 10 angstrom resolution, Science 269, 1083–1085 (1995)CrossRefADSGoogle Scholar
  25. 25.
    E. J. Sánchez, L. Novotny, X. S. Xie, Near-Field Fluorescence Microscopy Based on Two-Photon Excitation with Metal Tips, Phys. Rev. Lett. 82, 4014–4017 (1999)CrossRefADSGoogle Scholar
  26. 26.
    N. Hayazawa, Y. Inouye, Z. Sekkat, S. Kawata, Metallized tip amplification of near-field Raman scattering, Opt. Commun. 183, 333–336 (2000)CrossRefADSGoogle Scholar
  27. 27.
    J. Jersch, Nanostructure fabrication using laser field enhancement in the near-field of a scanning tunneling microscope tip, Appl. Phys. Lett. 68, 868–870 (1996)CrossRefADSGoogle Scholar
  28. 28.
    D. Courjon, Sarayeddine, M. Spajer, Scanning tunneling optical microscopy, Opt. Commun. 71, 23–28 (1989)CrossRefADSGoogle Scholar
  29. 29.
    R. C. Reddick, R. J. Warmack, T. L. Ferrell, New form of scanning optical microscopy, Phys. Rev. Lett. 39, 767–770 (1989)ADSGoogle Scholar
  30. 30.
    L. Novotny, R. X. Bian, X. S. Xie, Theory of Nanometric Optical Tweezers, Phys. Rev. Lett. 79, 645–648 (1997)CrossRefADSGoogle Scholar
  31. 31.
    Y. Inouye, S. Kawata, A Scanning near-field optical microscope having scanning electron tunneling microscope capability using a single metallic probe tip, J. Microsc. 178, 14–19 (1995)Google Scholar
  32. 32.
    B. Knoll, F. Keilmann, Near-field probing of vibrational absorption for chemical microscopy, Nature 399, 134–137 (1999)CrossRefADSGoogle Scholar
  33. 33.
    H. Furukawa, S. Kawata, Local field enhancement with an apertureless near-field-microscope probe, Opt. Commun. 148, 221–224 (1998)CrossRefADSGoogle Scholar
  34. 34.
    I. Newton, Optick, 4 ed. (1730) (Dover, New York 1952)Google Scholar
  35. 35.
    S. Zhu, A. W. Yu, D. Hawley, R. Roy, Frustrated total internal reflection: a demonstration and review, Am. J. Phys. 54, 601–606 (1986)CrossRefADSGoogle Scholar
  36. 36.
    H. Furukawa, S. Kawata, Analysis of image formation in a near-field scanning optical microscope: Effects of multiple scattering, Opt. Commun. 132, 170–178 (1996)CrossRefADSGoogle Scholar
  37. 37.
    J. C. Maxwell-Garnett, Colours in Metal Glasses and in Metallic Films, Philos. Trans. 203, 385–420 (1906)CrossRefADSGoogle Scholar
  38. 38.
    T. Okamoto, I. Yamaguchi, Field enhancement by a metallic sphere on dielectric substrates, Opt. Rev. 6, 211–214 (1999)CrossRefGoogle Scholar
  39. 39.
    X. S. Xie, R. C. Dunn, Probing Single Molecule Dynamics, Science 265, 361–364 (1994)CrossRefADSGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2001

Authors and Affiliations

  • Satoshi Kawata
    • 1
  1. 1.Department of Applied PhysicsOsaka UniversityOsakaJapan

Personalised recommendations