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An Enhanced Framework for Microprocessor Test-Program Generation

  • F. Corno
  • G. Squillero
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 2610)

Abstract

Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to give information about the machine that actually executes them. Today, the need for effective test programs is increasing, and, due to the inexorable increase in the number of transistor that can be integrated onto a single silicon die, devising effective test programs is getting more problematical. This paper presents μGP, an efficient and versatile approach to testprogram generation based on an evolutionary algorithm. The proposed methodology is highly versatile and improves previous approaches, allowing the testprogram generator generating complex assembly programs that include subroutines calls.

Keywords

Genetic Program Directed Acyclic Graph Test Program Assembly Language Conditional Branch 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2003

Authors and Affiliations

  • F. Corno
    • 1
  • G. Squillero
    • 1
  1. 1.Dipartimento di Automatica e InformaticaPolitecnico di TorinoTorinoItaly

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