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Formal Test Purposes and the Validity of Test Cases

  • Peter H. Deussen
  • Stephan Tobies
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 2529)

Abstract

We give a formalization of the notion of test purpose based on (suitably restricted) Message Sequence Charts. We define the validity of test cases with respect to such a formal test purpose and provide a simple decision procedure for validity.

Keywords

Test Purpose System Under Test Choice Point Message Sequence Chart Executable Test 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

  1. 1.
    H. Ben-Abdallah and S. Leue. Syntactic detection of process divergence and non-local choice in message sequence charts. In E. Brinksma, editor, Tools and Algorithms for the Construction and Analysis of Systems, volume 1217 of Lecture Notes in Computer Science, pages 259–274. Springer Verlag, 1997.CrossRefGoogle Scholar
  2. 2.
    P. Deussen. Concurrent automata. Technical Report 1-05/1998, Brandenburg Tech. Univ. Cottbus, 1998.Google Scholar
  3. 3.
    ETSI. The tree and tabular combined notation version 3; part 1: TTCN-3 core language. Technical Report ES 201 873-1, ETSI, 2001.Google Scholar
  4. 4.
    J. Grabowski. On partial languages. Fundamenta Informaticae, 4(2):427–498, 1981.zbMATHMathSciNetGoogle Scholar
  5. 5.
    J. Grabowski and D. Hogrefe. TTCN SDL-and MSC-based specification and automated test case generation for inap. In Proceedings of the 8th International Conference on Telecommunication Systems (ICTS’2000)-Modeling and Analysis, Nashville, March 2000.Google Scholar
  6. 6.
    ITU-T. ITU-T recommendation z.120 message sequence chart (MSC). Technical report, ITU-T, 1999.Google Scholar
  7. 7.
    B. Jonsson and G. Padilla. An execution semantics of MSC-2000. In R. Reed and J. Reed, editors, Proceedings of the 10th Internation SDL-Forum, number 2078 in Lecture Notes in Computer Science. Springer Verlag, 2001.Google Scholar
  8. 8.
    J.-P. Katoen and L. Lambert. Pomsets for message sequence charts. In Proc. of 1stWorkshop of the SDL Forum Society on SDL and MSC, SAM98, Berlin, 1998.Google Scholar
  9. 9.
    S. Mauw and M.A. Reniers. Operational semantics for MSC’96. In A. Cavalli and D. Vincent, editors, Tutorials of the Eighth SDL Forum SDl’97: Time for Testing-SDL, MSC and Trends, pages 135–152, Evry, France, 1997. Institut national des télécommunications.Google Scholar
  10. 10.
    A. Mazurkiewicz. Introduction to trace theory. In V. Diekert and G. Rozenberg, editors, The Book of Traces, chapter 1, pages 3–42.World Scientific, Singapore-New Jersey-London-Hong Kong, 1995.Google Scholar
  11. 11.
    V. Pratt. Modelling concurrency with partial orders. International Journal of Parallel Programming, 15(1):33–71, 1986.zbMATHCrossRefMathSciNetGoogle Scholar
  12. 12.
    R. Scheurer, J. Grabowski, and D. Hogrefe. Revised comparison of an automatically generated and a manually specified test suite for the B-ISDN protocol SSCOP. In H. König and P. Langendörfer, editors, FBT’98-Formale Beschreibungstechniken für verteilte Systeme. Shaker Verlag, Aachen, 1998. Available online from http://www.itm.mu-luebeck.de/.
  13. 13.
    S. Schhulz and T. Vassiliou-Gioles. Implementation of TTCN-3 test systems using the TRI. In I. Schieferdecker, K. H, and A. Wolisz, editors, Testing of Communication Systems XIV, Proc. of TestCom-2002, pages 425–442, Berlin, Germany, 2002. Kluwer Academic Publishers.Google Scholar
  14. 14.
    M. Schmitt, M. Ebner, and J. Grabowski. Test generation with autolink and testcomposer. In Proceedings of the 2nd Workshop of the SDL Forum Society on SDL and MSC (SAM’2000). SDL Forum Society, 2000. Proceedings available online from http://www.irisa.fr/manifestations/2000/sam2000/.

Copyright information

© Springer-Verlag Berlin Heidelberg 2002

Authors and Affiliations

  • Peter H. Deussen
    • 1
  • Stephan Tobies
    • 2
  1. 1.Fraunhofer FOKUSBerlinGermany
  2. 2.Nokia Research CenterBochumGermany

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