Total Internal Reflection Ellipsometry: Monitoring of Proteins on Thin Metal Films
A measurement technique based on ellipsometry performed under conditions of total internal reflection is presented here. This technique is called total internal reflection ellipsometry (TIRE). When extended with the surface plasmon resonance effect, TIRE becomes a powerful tool for monitoring protein adsorption on thin metal films. A brief description of TIRE is presented here together with some examples of measurement system setups. Two examples of applications are included, followed by a short presentation of possible future applications of TIRE.
KeywordsSurface Plasmon Resonance Metal Layer Protein Adsorption Thin Metal Film Ellipsometric Measurement
Unable to display preview. Download preview PDF.
- Azzam RMA, Bashara NM (1987) Ellipsometry and Polarized Light. North Holland, AmsterdamGoogle Scholar
- Bortchagovsky EG (1997) Proc SPIE 3094:239–249Google Scholar
- Palik ED (ed) (1985) Handbook of Optical Constants of Solids. Academic Press, WashingtonGoogle Scholar
- Palik ED (ed) (1991) Handbook of Optical Constants of Solids II. Academic Press, SanDiegoGoogle Scholar
- Pedrotti FL, Pedrotti LS (1996) Introduction to Optics. Prentice-Hall International, Upper Saddle River, NJGoogle Scholar
- Raether H (1988) Surface Plasmons on Rough Surfaces and on Gratings. Springer Verlag, Berlin HeidelbergGoogle Scholar
- Rekveld S (1997) Ellipsometric Studies of Protein Adsorption onto Hard Surfaces in a Flow Cell. Fedobruk, EnschedeGoogle Scholar
- Tompkins HG, Irene EA (eds) (2005) Handbook of Ellipsometry, William Andrew, Norwich, NYGoogle Scholar
- Tompkins HG, McGahan WA (1999) Spectroscopic Ellipsometry and Reflectometry: a User’s Guide. John Wiley & Sons, New YorkGoogle Scholar
- Yeh P (1988) Optical Waves in Layered Media, John Wiley & Sons, New YorkGoogle Scholar