Outlook

  • M. Yamashita
  • H. Shigekawa
  • R. Morita
Part of the Springer Series in Optical Sciences book series (SSOS, volume 99)

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References

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    T. Sakurai, T. Watanabe: Advances in Scanning Probe Microscopy, (Springer, Berlin, 1999)Google Scholar
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    R. Wisendanger: Scanning Probe Microscopy (Springer, Berlin, 1998)Google Scholar
  3. 3.
    S. Morita, R. Wiesendanger, E. Meyer: Noncontact Atomic Force Microscopy (Springer, Berlin, 2003)Google Scholar
  4. 4.
    R. Wiesendanger: Scanning Probe Microscopy and Spectroscopy (Cambridge University Press, Cambridge, 1994)CrossRefGoogle Scholar
  5. 5.
    S. Grafström: J. Appl. Phys. 91, 1717 (2002)ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • M. Yamashita
    • 1
  • H. Shigekawa
    • 2
  • R. Morita
    • 1
  1. 1.Department of Applied PhysicsHokkaido UniversitySapporoJapan
  2. 2.Institute of Applied PhysicsUniversity of TsukubaTsukubaJapan

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