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  • M. Yamashita
  • H. Shigekawa
  • R. Morita
Part of the Springer Series in Optical Sciences book series (SSOS, volume 99)

Keywords

Atomic Force Microscopy Electron Spin Resonance Scan Probe Microscopy Tunneling Current Cycle Pulse 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    T. Sakurai, T. Watanabe: Advances in Scanning Probe Microscopy, (Springer, Berlin, 1999)Google Scholar
  2. 2.
    R. Wisendanger: Scanning Probe Microscopy (Springer, Berlin, 1998)Google Scholar
  3. 3.
    S. Morita, R. Wiesendanger, E. Meyer: Noncontact Atomic Force Microscopy (Springer, Berlin, 2003)Google Scholar
  4. 4.
    R. Wiesendanger: Scanning Probe Microscopy and Spectroscopy (Cambridge University Press, Cambridge, 1994)CrossRefGoogle Scholar
  5. 5.
    S. Grafström: J. Appl. Phys. 91, 1717 (2002)ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • M. Yamashita
    • 1
  • H. Shigekawa
    • 2
  • R. Morita
    • 1
  1. 1.Department of Applied PhysicsHokkaido UniversitySapporoJapan
  2. 2.Institute of Applied PhysicsUniversity of TsukubaTsukubaJapan

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