• M. Yamashita
  • H. Shigekawa
  • R. Morita
Part of the Springer Series in Optical Sciences book series (SSOS, volume 99)


Atomic Force Microscopy Electron Spin Resonance Scan Probe Microscopy Tunneling Current Cycle Pulse 
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    S. Morita, R. Wiesendanger, E. Meyer: Noncontact Atomic Force Microscopy (Springer, Berlin, 2003)Google Scholar
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    R. Wiesendanger: Scanning Probe Microscopy and Spectroscopy (Cambridge University Press, Cambridge, 1994)CrossRefGoogle Scholar
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    S. Grafström: J. Appl. Phys. 91, 1717 (2002)ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • M. Yamashita
    • 1
  • H. Shigekawa
    • 2
  • R. Morita
    • 1
  1. 1.Department of Applied PhysicsHokkaido UniversitySapporoJapan
  2. 2.Institute of Applied PhysicsUniversity of TsukubaTsukubaJapan

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