Study of Ferromagnet-Antiferromagnet Interfaces Using X-Ray PEEM

  • A. Scholl
  • H. Ohldag
  • F. Nolting
  • S. Anders
  • J. Stöhr
Chapter
Part of the NanoScience and Technology book series (NANO)

Abstract

This chapter discusses polarization dependent X-ray photoemission electron microscopy (X-PEEM) and its application to coupled magnetic layers, in particular ferromagnet-antiferromagnet structures.

Keywords

Magnetic Axis Exchange Bias Magnetic Origin Twin Domain PEEM Image 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
This is a preview of subscription content, log in to check access.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    J.B. Kortright, D.D. Awschalom, J. Stöhr, S.D. Bader, Y.U. Idzerda, S.S.P. Parkin, I.K. Schuller, and H.C. Siegmann, J. Magn. Magn. Mater. 207, 7 (1999).CrossRefGoogle Scholar
  2. 2.
    P.A. Grünberg, Sensors and Actuators A 91, 153 (2001).CrossRefGoogle Scholar
  3. 3.
    G. Prinz, Science 282, 1660 (1998), G. Prinz, J. Magn. Magn. Mater. 200, 57 (1999).CrossRefGoogle Scholar
  4. 4.
    R. Fiederling, M. Keim, G. Reuscher, W. Ossau, G. Schmidt, A. Waag, and L.W. Molenkamp, Nature 402, 787 (1999).CrossRefGoogle Scholar
  5. 5.
    H. Ohno, Science 281, 951 (5379).Google Scholar
  6. 6.
    J. Nogues and I.K. Schuller, J. Magn. Magn. Mater. 192, 203 (1999).CrossRefGoogle Scholar
  7. 7.
    A.E. Berkowitz and K.J. Takano, Magn. Magn. Mater. 200, 552 (1999).CrossRefGoogle Scholar
  8. 8.
    W.H. Meiklejohn and C.P. Bean, Phys. Rev. 105, 904 (1956).CrossRefGoogle Scholar
  9. 9.
    K. Takano, R.H. Kodama, A.E. Berkowitz, W. Cao, and G. Thomas, Phys. Rev. Lett. 79, 1130 (1997).CrossRefGoogle Scholar
  10. 10.
    W.L. Roth, J. Appl. Phys. 31, 2000 (1960).CrossRefGoogle Scholar
  11. 11.
    T. Yamada, S. Saito, and Y. Shimomura, J. Phys. Soc. Jpn. 21, 672 (1966).CrossRefGoogle Scholar
  12. 12.
    J. Baruchel, Physica B 192, 79 (1993).CrossRefGoogle Scholar
  13. 13.
    S. Saito, M. Miura, and K. Kurosawa, Journal of Physics. C 13, 1513 (1980).Google Scholar
  14. 14.
    J. Stöhr, A. Scholl, T.J. Regan, S. Anders, J. Lüning, M.R. Scheinfein, H.A. Padmore, and R.L. White, Phys. Rev. Lett. 83, 1862 (1999)CrossRefGoogle Scholar
  15. 15.
    M. Fiebig, D. Frölich, G. Sluyterman v.L., R.V. Pisarev, Appl. Phys. Lett. 66, 2906 (1995)CrossRefGoogle Scholar
  16. 16.
    M. Fiebig, D. Fröhlich, S. Leute, and R.V. Pisarev, Appl. Phys. B 66, 265 (1998).CrossRefGoogle Scholar
  17. 17.
    N.C. Koon, Phys. Rev. Lett. 78, 4865 (1997).CrossRefGoogle Scholar
  18. 18.
    T.C. Schulthess and W.H. Butler, Phys. Rev. Lett. 81, 4516 (1998).CrossRefGoogle Scholar
  19. 19.
    P. Miltenyi, M. Gierlings, J. Keller, B. Beschoten, G. Güntherodt, U. Nowak, and K.D. Usadel, Phys. Rev. Lett. 84, 4224 (2000).CrossRefGoogle Scholar
  20. 20.
    J. Stöhr, H.A. Padmore, S. Anders, T. Stammler, and M.R. Scheinfein, Surf. Lett. Rev. 5, 1297 (1998).CrossRefGoogle Scholar
  21. 21.
    J. Stöhr and S. Anders, IBM J. Res. Develop. 44, 535 (2000).Google Scholar
  22. 22.
    B.T. Thole, G. van der Laan, and G.A. Sawatzky, Phys. Rev. Lett. 55, 2086 (1985).CrossRefGoogle Scholar
  23. 23.
    G. van der Laan, B.T. Thole, G.A. Sawatzky, J.B. Goedkoop, J.C. Fuggle, J.-M. Esteva, R. Karnatak, J.P. Remeika, and H.A. Dabkowska, Phys. Rev. B 34, 6529 (1986).CrossRefGoogle Scholar
  24. 24.
    P. Carra, H. Konig, B.T. Thole, and M. Altarelli, Physica B 192, 182 (1993).CrossRefGoogle Scholar
  25. 25.
    P. Kuiper, B.G. Searle, P. Rudolf, L.H. Tjeng, and C.T. Chen, Phys. Rev. Lett. 70, 1549 (1993).CrossRefGoogle Scholar
  26. 26.
    D. Alders, L.H. Tjeng, F.C. Voogt, T. Hibma, G.A. Sawatzky, C.T. Chen, J. Vogel, M. Sacchi, and S. Iacobucci, Phys. Rev. B 57, 11623 (1998).CrossRefGoogle Scholar
  27. 27.
    G. Schütz, W. Wagner, W. Wilhelm, P. Kienle, R. Zeller, R. Frahm, and G. Materlik, Phys. Rev. Lett. 58, 737 (1987).CrossRefGoogle Scholar
  28. 28.
    C.T. Chen, F. Sette, Y. Ma, and S. Modesti, Phys. Rev. B 42, 7262 (1990).CrossRefGoogle Scholar
  29. 29.
    J. Stöhr and R. Nakajima, IBM J. Res. Develop. 42, 73 (1998).CrossRefGoogle Scholar
  30. 30.
    R. Nakajima, J. Stöhr, and Y.U. Idzerda, Phys. Rev. B 59, 6421 (1999).CrossRefGoogle Scholar
  31. 31.
    J. Stöhr, Y. Wu, B.D. Hermsmeier, M.G. Samant, G.R. Harp, S. Koranda, D. Dunham, and B.P. Tonner, Science 259, 658 (1993).Google Scholar
  32. 32.
    J. Stöhr, “NEXAFS Spectroscopy”, Springer Series in Surface Sciences 25, Springer, Berlin (1992).Google Scholar
  33. 33.
    J. Stöhr, J. Magn. Magn. Mat. 200, 470 (1999).CrossRefGoogle Scholar
  34. 34.
    P. Fischer, T. Eimüller, G. Schütz, G. Denbeaux, A. Pearson, L. Johnson, D. Attwood, S. Tsunashima, M. Kumazawa, N. Takagi, M. Kohler, and G. Bayreuther, Rev. Sci. Instrum. 72, 2322 (2001).CrossRefGoogle Scholar
  35. 35.
    D. Attwood, “Soft X-Rays and Extreme Ultraviolet Radiation”, Cambridge University Press (2000).Google Scholar
  36. 36.
    S. Anders, H.A. Padmore, R.M. Duarte, T. Renner, Th. Stammler, A. Scholl, M.R. Scheinfein, J. Stöhr, L. S'eve, and B. Sinkovic, Rev. Sci. Instrum. 70, 3973 (1999).CrossRefGoogle Scholar
  37. 37.
    T.J. Regan, H. Ohldag, C. Stamm, F. Nolting, J. Lüning, J. Stöhr, and R.L. White, Phys. Rev. B 64, 214422 (2001).CrossRefGoogle Scholar
  38. 38.
    J. Lüning, F. Nolting, H. Ohldag, A. Scholl, E.E. Fullerton, M. Toney, J.W. Seo, J. Fompeyrine, H. Siegwart, J.-P. Locquet, and J. Stöhr, submitted to Phys. Rev. B (2002)Google Scholar
  39. 39.
    A. Scholl, J. Stöhr, J. Lüning, J.W. Seo, J. Fompeyrine, H. Siegwart, J.-P. Locquet, F. Nolting, S. Anders, E.E. Fullerton, M.R. Scheinfein, and H.A. Padmore, Science 287, 1014 (2000).CrossRefGoogle Scholar
  40. 40.
    G. Rempfer and O.H. Griffith, Ultramicroscopy 27, 273 (1989).CrossRefGoogle Scholar
  41. 41.
    B.L. Henke, J.A. Smith, and D.A. Attwood, J. Appl. Phys. 48, 1852 (1977).CrossRefGoogle Scholar
  42. 42.
    E. Bauer, in “Chemical, Structural, and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale,” R. Rosei, Ed., Kluwer Acad. Publ., Dortrecht (1997)Google Scholar
  43. 43.
    G. De Stasio, L. Perfetti, B. Gilbert, O. Fauchoux, M. Capozi, P. Perfetti, G. Margaritondo, and B.P. Tonner, Rev. Sci. Instrum. 70, 1740 (1999).CrossRefGoogle Scholar
  44. 44.
    F. Nolting, A. Scholl, J. Stöhr, J.W. Seo, J. Fompeyrine, H. Siegwart, J.-P. Locquet, S. Anders, J. Lüning, E.E. Fullerton, M.F. Toney, M.R. Scheinfein, and H.A. Padmore, Nature 405, 767 (2000).CrossRefGoogle Scholar
  45. 45.
    D.S. Deng, X.F. Jin and R. Tao, Phys. Rev. B 65, 132406 (2002).CrossRefGoogle Scholar
  46. 46.
    I.M. Lifshitz, Sov. Phys. JETP 15, 939 (1962).Google Scholar
  47. 47.
    M.M. Farztdinov, Sov. Phys. Usp. 7, 855 (1965).CrossRefGoogle Scholar
  48. 48.
    Y.Y. Li, Phys. Rev. 101, 1450 (1956).CrossRefGoogle Scholar
  49. 49.
    M.M. Farztdinov, Phys. Met. Metall. 19, 10 (1965).Google Scholar
  50. 50.
    G.A. Slack, J. Appl. Phys. 31, 1571 (1960).CrossRefGoogle Scholar
  51. 51.
    F.U. Hillebrecht, H. Ohldag, N. B. Weber, C. Bethke, U. Mick, M. Weiss, and J. Bahrdt, Phys. Rev. Lett. 86, 3419 (2001).CrossRefGoogle Scholar
  52. 52.
    H. Ohldag, A. Scholl, F. Nolting, S. Anders, F. U. Hillebrecht, and J. Stöhr, Phys. Rev. Lett. 86, 2878 (2001).CrossRefGoogle Scholar
  53. 53.
    H. Ohldag, T.J. Regan, J. Stöhr, A. Scholl, F. Nolting, J. Lüning, C. Stamm, S. Anders, and R.L. White, Phys. Rev. Lett. 87, 247201 (2001).CrossRefGoogle Scholar
  54. 54.
    R. Fink, M.R. Weiss, E. Umbach, D. Preikszas, H. Rose, R. Spehr, P. Hartel, W. Engel, R. Degenhardt, R. Wichtendahl, H. Kuhlenbeck, W. Erlebach, K. Ihmann, R. Schlogl, H.J. Freund, A.M. Bradshaw, G. Lilienkamp, T. Schmidt, E. Bauer, and G. Benner, J. Electron Spectrosc. Relat. Phenom. 84, 231 (1997).CrossRefGoogle Scholar
  55. 55.
    R. Wichtendahl, R. Fink, H. Kuhlenbeck, D. Preikszas, H. Rose, R. Spehr, P. Hartel, W. Engel, R. Schlogl, H.J. Freund, A.M. Bradshaw, G. Lilienkamp, E. Bauer, T. Schmidt, G. Benner, and E. Umbach, Surf. Rev. Lett. 5, 1249 (1998).CrossRefGoogle Scholar
  56. 56.
    J. Feng, H.A. Padmore, D.H. Wei, S. Anders; Y. Wu, A. Scholl, and D. Robin, Rev. Sci. Instrum. 73, 1514 (2002).CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • A. Scholl
  • H. Ohldag
  • F. Nolting
  • S. Anders
  • J. Stöhr

There are no affiliations available

Personalised recommendations