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From Local Pattern Mining to Relevant Bi-cluster Characterization

  • Ruggero G. Pensa
  • Jean-François Boulicaut
Part of the Lecture Notes in Computer Science book series (LNCS, volume 3646)

Abstract

Clustering or bi-clustering techniques have been proved quite useful in many application domains. A weakness of these techniques remains the poor support for grouping characterization. We consider eventually large Boolean data sets which record properties of objects and we assume that a bi-partition is available. We introduce a generic cluster characterization technique which is based on collections of bi-sets (i.e., sets of objects associated to sets of properties) which satisfy some user-defined constraints, and a measure of the accuracy of a given bi-set as a bi-cluster characterization pattern. The method is illustrated on both formal concepts (i.e., “maximal rectangles of true values”) and the new type of δ-bi-sets (i.e., “rectangles of true values with a bounded number of exceptions per column”). The added-value is illustrated on benchmark data and two real data sets which are intrinsically noisy: a medical data about meningitis and Plasmodium falciparum gene expression data.

Keywords

Association Rule Formal Concept Association Rule Mining Minimal Frequency Subgroup Discovery 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2005

Authors and Affiliations

  • Ruggero G. Pensa
    • 1
  • Jean-François Boulicaut
    • 1
  1. 1.INSA Lyon, LIRIS CNRS, UMR 5205Villeurbanne, cedexFrance

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